BS CECC 16100:1980
Current
The latest, up-to-date edition.
Harmonized system of quality assessment for electronic components. Sectional specification: electromechanical all-or-nothing relays
Hardcopy , PDF
English
29-08-1980
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Foreword
Preface
Section 1 - Scope
Section 2 - General
2.1 Related documents
Section 3 - Quality assessment procedures
3.1 Primary stage of manufacture
3.2 Structurally similar relays
3.3 Qualification approval tests
3.4 Formation of inspection lots
3.5 Test schedules
3.6 Order of tests
Section 4 - Writing of blank detail and detail
specifications
4. Table I, Test schedules, with explanations
Section 5 - Marking
5.1 Relay
5.2 Package
Appendix A - Explanations and examples regarding IL-
and AQL-values
Selects from the generic specification BS CECC 16000 the appropriate methods of test to be used in detail specifications for the above. Presents 3 basic test schedules and gives rules for writing blank detail specifications which contain the detailed test schedules.
| Committee |
W/-
|
| DevelopmentNote |
Supersedes 77/29527 DC. Inactive for the new design. (01/2006)
|
| DocumentType |
Standard
|
| Pages |
22
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
| Standards | Relationship |
| CECC 16100 : 1979 | Identical |
| CECC 16101 : 1980 | HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BLANK DETAIL SPECIFICATION - ELECTROMECHANICAL ALL-OR-NOTHING RELAYS - TEST SCHEDULE 3 |
| BS CECC 16101:1980 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Electromechanical all-or-nothing relays. Test schedule 3 |
| BS 9000(1967) : LATEST | |
| BS 9151:1972 | Rules for the preparation of detail specifications for all-or-nothing electromechanical relays of assessed quality. Full and basic assessment levels |
| CECC 00100 : 1988 | BASIC RULES - TO BE USED IN CONNECTION WITH THE INTERNAL REGULATIONS OF THE FEN e.V |
| IEC 60410:1973 | Sampling plans and procedures for inspection by attributes |
| BS E9000-1(1977) : LATEST | |
| IEC 60225:1966 | Octave, half-octave and third-octave band filters intended for the analysis of sounds and vibrations |
| BS 6001(1972) : AMD 5054 | SAMPLING PROCEDURES FOR INSPECTION BY ATTRIBUTES - SPECIFICATION FOR SAMPLING PLANS INDEXED BY ACCEPTABLE QUALITY LEVEL (AQL) FOR LOT - BY - LOT INSPECTION |
| BS E9000-2(1978) : LATEST |
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