BS 9750:1990
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
Specification for fixed radio frequency inductors of assessed quality: generic data and methods of test
Hardcopy , PDF
15-10-1996
English
30-11-1990
Committees responsible
Foreword
Specification
Section 1. General
1.1 Scope
1.2 Related documents
1.3 Terminology
1.4 Letter symbols, signs and abbreviations
1.5 Graphical symbols
1.6 Marking
1.7 Eligibility for qualification approval
1.8 Structurally similar components
1.9 Delayed delivery
1.10 Supplementary procedure for qualification approval
1.11 Certified test records
1.12 Standard ratings and characteristics
1.13 Additional information (not for inspection
purposes)
1.14 Procedure to be followed in the event of failure
at group C or D inspection
1.15 Ordering information
1.16 Release for delivery before the completion of
group B tests
Section 2. Tests
2.1 Conditions of test
2.2 Test fixtures (electrical measurements)
2.3 Visual inspection
2.4 Dimensioning and gauging procedure
2.5 Electrical test procedures
2.6 Environmental test procedures
2.7 Endurance at 70 deg C
Appendices
A Colour coding for inductors
B Recommended schemes for the inspection of
structurally similar components
C Example of a certified test record
D Typical test substrate for SMDs
E Residual inductance measurement
Tables
1 Temperature characteristic of inductance
2 Slot width for gauge plates
3 Sampling plan for group C test for inductors
Figures
1 Gauge plate for components with axial wire
terminations
2 Gauge plate for components with a diameter of 5 mm
and over, with axial wire termination and with
glass/metal seals or with discontinuities in the
wire terminations
3 Ellipsoidal component with radial leads
4 Bending jig for surface mounting components
5 Colour coding for inductors
6 Typical test substrate for SMDs
7 Test fixture TF-A (for axial leads)
8 Test fixture TF-B (for axial leads)
9 Test fixture TF-C (for radial leads only)
10 Typical test fixture TF-D for unmounted SMDs
11 Typical test fixture TF-E for substrate mounted
SMDs
12 Shorting bars for test fixtures
13 Test clip, right hand or left hand
Essential test procedures and general requirements.
Committee |
EPL/51
|
DevelopmentNote |
Superseded by BS EN 129000 but remains current. Supersedes 88/33864 DC. Inactive for the new design. (08/2005)
|
DocumentType |
Standard
|
Pages |
36
|
PublisherName |
British Standards Institution
|
Status |
Superseded
|
SupersededBy | |
Supersedes |
BS 4000:1968 | Sizes of paper and board |
BS 9000(1967) : LATEST | |
BS 7151(1989) : AMD 7825 | SPECIFICATION FOR REPRESENTATION OF DATES AND TIMES IN INFORMATION INTERCHANGE |
BS 2488:1966 | Schedule of preferred numbers for the resistance of resistors and the capacitance of capacitors for telecommunication equipment |
BS 2011(1967) : LATEST | |
BS 6001(1972) : AMD 5054 | SAMPLING PROCEDURES FOR INSPECTION BY ATTRIBUTES - SPECIFICATION FOR SAMPLING PLANS INDEXED BY ACCEPTABLE QUALITY LEVEL (AQL) FOR LOT - BY - LOT INSPECTION |
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