ASTM F 1032 : 1991
Withdrawn
A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.
Guide for Measuring Time-Dependant Total-Dose Effects in Semiconductor Devices Exposed to Pulsed Ionizing Radiation (Withdrawn 1994)
01-05-1996
31-12-2010
CONTAINED IN VOL 10.04 Gives prerequisites and methods for testing semiconductor devices, both discrete and integrated circuits, for time-dependent effects from short pulse (less than 60 micro m) exposures to ionizing radiation. May produce severe degradation of electrical properties of irradiated devices and should be considered as destructive.
| Committee |
ASTM
|
| DocumentType |
Guide
|
| PublisherName |
American Society for Testing and Materials
|
| Status |
Withdrawn
|
| ASTM F 980M : 1996 : R2003 | Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices [Metric] |
| MIL-HDBK-817 Base Document:1994 | SYSTEM DEVELOPMENT RADIATION HARDNESS ASSURANCE |
| ASTM F 980M : 1996 | Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices [Metric] |
| ASTM F 526 : 2016 : REDLINE | Standard Test Method for Using Calorimeters for Total Dose Measurements in Pulsed Linear Accelerator or Flash X-ray Machines |
| ASTM E 668 : 2013 : REDLINE | Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices |
| ASTM E 820 : 1981 | Practice for Determining Absolute Absorbed Dose Rates for Electron Beams (Withdrawn 1987) |
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