ASTM E 561 : 2023

1.1 This test method covers the determination of the resistance to fracture of metallic materials under Mode I loading at static rates using either of the following notched and precracked specimens: the middle-cracked tension M(T) specimen or the compact tension C(T) specimen. A K_R curve is a continuous record of toughness development (resistance to crack extension) in terms of K_R plotted against crack extension in the specimen as a crack is driven under an increasing stress intensity factor, K. (1)2

1.2Materials that can be tested for K_R curve development are not limited by strength, thickness, or toughness, so long as specimens are of sufficient size to remain predominantly elastic to the effective crack extension value of interest.

1.3Specimens of standard proportions are required, but size is variable, to be adjusted for yield strength and toughness of the materials.

1.4Only two of the many possible specimen types that could be used to develop K_R curves are covered in this method.

1.5The test is applicable to conditions where a material exhibits slow, stable crack extension under increasing crack driving force, which may exist in relatively tough materials under plane stress crack tip conditions.

1.6The values stated in SI units are to be regarded as standard. The values given in parentheses after SI units are provided for information only and are not considered standard.

1.7This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.

1.8This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.