ASTM E 431 : 1996 : R2016
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
Standard Guide to Interpretation of Radiographs of Semiconductors and Related Devices
Hardcopy , PDF
18-10-2022
English
22-06-2016
Important note : All end users must be registered with an Account prior to user licenses being assigned.CONTAINED IN VOL. 03.03, 2017 Gives illustrations of radiographs of semiconductors and related devices.
| Committee |
E 07
|
| DocumentType |
Guide
|
| Pages |
7
|
| ProductNote |
Reconfirmed 2016
|
| PublisherName |
American Society for Testing and Materials
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
1.1This guide provides illustrations of radiographs of semiconductors and related devices. Low powered transistors (through the TO-11 case configuration), diodes, low-power rectifiers, power devices, and integrated circuits are illustrated with common assembly features. Particular areas of construction are featured for these devices detailing critical points of design or assembly.
1.2This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
| ASTM E 543 : 2021 | Standard Specification for Agencies Performing Nondestructive Testing |
| ASTM E 1161 : 2021 | Standard Practice for Radiographic Examination of Semiconductors and Electronic Components |
| ASTM E 1316 : 2022 : REV A | Standard Terminology for Nondestructive Examinations |
| ASTM E 1316 : 2011 : REV B | Standard Terminology for Nondestructive Examinations |
| ASTM E 1316 : 2015 : REV A | Standard Terminology for Nondestructive Examinations |
| ASTM E 801 : 2016 : REDLINE | Standard Practice for Controlling Quality of Radiographic Examination of Electronic Devices |
| ASTM E 1255 : 2009 | Standard Practice for Radioscopy |
| ASTM E 1316 : 2009 : REV A | Standard Terminology for Nondestructive Examinations |
| ASTM E 1316 : 2008 : REV A | Standard Terminology for Nondestructive Examinations |
| ASTM E 1316 : 2010 : REV C | Standard Terminology for Nondestructive Examinations |
| ASTM E 1316 : 2020 : REV A | Standard Terminology for Nondestructive Examinations |
| ASTM E 1316 : 2017 | Standard Terminology for Nondestructive Examinations |
| ASTM E 1316 : 2013 : REV C | Standard Terminology for Nondestructive Examinations |
| ASTM E 1161 : 1995 | Standard Test Method for Radiologic Examination of Semiconductors and Electronic Components |
| ASTM E 1316 : 2000 : REV A | Standard Terminology for Nondestructive Examinations |
| ASTM E 1255 : 1996 | Standard Practice for Radioscopy |
| ASTM E 1316 : 2019 : REV A | Standard Terminology for Nondestructive Examinations |
| ASTM E 1316 : 2014 | Standard Terminology for Nondestructive Examinations |
| ASTM E 801 : 2016 | Standard Practice for Controlling Quality of Radiographic Examination of Electronic Devices |
| ASTM E 1316 : 2013 : REV B | Standard Terminology for Nondestructive Examinations |
| ASTM E 1316 : 2018 | Standard Terminology for Nondestructive Examinations |
| ASTM E 801 : 1991 : R1995 : EDT 1 | Standard Practice for Controlling Quality of Radiological Examination of Electronic Devices |
| ASTM E 1316 : 2011 : REV A | Standard Terminology for Nondestructive Examinations |
| ASTM E 1316 : 2007 : REV A | Standard Terminology for Nondestructive Examinations |
| ASTM E 1316 : 2015 | Standard Terminology for Nondestructive Examinations |
| ASTM E 1316 : 2019 : REV B | Standard Terminology for Nondestructive Examinations |
| ASTM E 1316 : 2021 : REV A | Standard Terminology for Nondestructive Examinations |
| ASTM E 1316 : 2013 : REV D | Standard Terminology for Nondestructive Examinations |
| ASTM E 1316 : 2000 | Standard Terminology for Nondestructive Examinations |
| ASTM E 1316 : 2019 | Standard Terminology for Nondestructive Examinations |
| ASTM E 1316 : 2001 | Standard Terminology for Nondestructive Examinations |
| ASTM E 1161 : 2009 : R2014 | Standard Practice for Radiologic Examination of Semiconductors and Electronic Components |
| ASTM E 1316 : 2003 | Standard Terminology for Nondestructive Examinations |
| ASTM E 1316 : 2018 : REV A | Standard Terminology for Nondestructive Examinations |
| ASTM E 1316 : 2006 : REV A | Standard Terminology for Nondestructive Examinations |
| ASTM E 1316 : 2016 | Standard Terminology for Nondestructive Examinations |
| ASTM E 1316 : 2021 : REV D | Standard Terminology for Nondestructive Examinations |
| ASTM E 1316 : 2002 : REV A | Standard Terminology for Nondestructive Examinations |
| ASTM E 1161 : 2021 | Standard Practice for Radiographic Examination of Semiconductors and Electronic Components |
| ASTM E 1316 : 2014 : EDT 1 | Standard Terminology for Nondestructive Examinations |
| ASTM E 1255 : 2016 : REDLINE | Standard Practice for Radioscopy |
| ASTM E 1316 : 2010 : REV A | Standard Terminology for Nondestructive Examinations |
| ASTM E 1316 : 2022 | Standard Terminology for Nondestructive Examinations |
| ASTM E 1161 : 2009 | Standard Practice for Radiologic Examination of Semiconductors and Electronic Components |
| ASTM E 1316 : 2013 | Standard Terminology for Nondestructive Examinations |
| ASTM E 1316 : 2021 : REV B | Standard Terminology for Nondestructive Examinations |
| ASTM E 1316 : 2017 : REV A | Standard Terminology for Nondestructive Examinations |
| ASTM E 1316 : 2016 : REV A | Standard Terminology for Nondestructive Examinations |
| ASTM E 1161 : 2003 | Standard Test Method for Radiologic Examination of Semiconductors and Electronic Components |
| ASTM E 1316 : 2009 | Standard Terminology for Nondestructive Examinations |
| ASTM E 1316 : 2002 | Standard Terminology for Nondestructive Examinations |
| ASTM E 801 : 2021 | Standard Practice for Controlling Quality of Radiographic Examination of Electronic Devices |
| ASTM E 1316 : 2004 : REV A | Standard Terminology for Nondestructive Examinations |
| ASTM E 1316 : 2007 : REV C | Standard Terminology for Nondestructive Examinations |
| ASTM E 1316 : 2010 : REV B | Standard Terminology for Nondestructive Examinations |
| ASTM E 1316 : 2013 : REV A | Standard Terminology for Nondestructive Examinations |
| ASTM E 1316 : 2021 | Standard Terminology for Nondestructive Examinations |
| ASTM E 1316 : 2007 : REV B | Standard Terminology for Nondestructive Examinations |
| ASTM E 1316 : 2005 | Standard Terminology for Nondestructive Testing |
| ASTM E 1316 : 2004 | Standard Terminology for Nondestructive Examinations |
| ASTM E 1316 : 2021 : REV C | Standard Terminology for Nondestructive Examinations |
| ASTM E 1316 : 2007 | Standard Terminology for Nondestructive Examinations |
| ASTM E 1255 : 2016 | Standard Practice for Radioscopy |
| ASTM E 1316 : 2012 | Standard Terminology for Nondestructive Examinations |
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