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13/30277845 DC : 0

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

View Superseded by

BS EN 62149-8 ED 1.0 - FIBRE OPTIC ACTIVE COMPONENTS AND DEVICES - PERFORMANCE STANDARD - PART 8: SEEDED REFLECTIVE SEMICONDUCTOR OPTICAL AMPLIFIER DEVICES

Available format(s)

Hardcopy , PDF

Superseded date

31-07-2014

Superseded by

BS EN 62149-8:2014

Language(s)

English

£20.00
Excluding VAT

FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms, definitions, symbols and abbreviated terms
4 Product parameters
5 Testing
6 Environmental specifications
Annex A (normative) - Specifications for seeded RSOA devices
Bibliography

BS EN 62149-8 Ed 1.0

Committee
GEL/86/3
DocumentType
Draft
Pages
16
PublisherName
British Standards Institution
Status
Superseded
SupersededBy

IEC 60950-1:2005+AMD1:2009+AMD2:2013 CSV Information technology equipment - Safety - Part 1: General requirements
IEC GUIDE 107:2014 Electromagnetic compatibility - Guide to the drafting of electromagnetic compatibility publications
IEC 62007-1:2015 Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Specification template for essential ratings and characteristics
IEC 60749-25:2003 Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling
IEC 61300-2-48:2009 Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-48: Tests - Temperature-humidity cycling
IEC 61290-1-3:2015 Optical amplifiers - Test methods - Part 1-3: Power and gain parameters - Optical power meter method
IEC 60749-11:2002 Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method
IEC 60825-1:2014 Safety of laser products - Part 1: Equipment classification and requirements
IEC 62007-2:2009 Semiconductor optoelectronic devices for fibre optic system applications - Part 2: Measuring methods
IEC 60749-26:2013 Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
IEC 60749-7:2011 Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases
IEC 60749-6:2017 Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature
IEC 62148-1:2017 Fibre optic active components and devices - Package and interface standards - Part 1: General and guidance
IEC 60747-5-1:1997+AMD1:2001+AMD2:2002 CSV Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices - General
IEC 61300-2-4:1995 Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-4: Tests - Fibre/cable retention
IEC 60749-10:2002 Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock
IEC 62149-1:2011 Fibre optic active components and devices - Performance standards - Part 1: General and guidance
IEC 61300-2-19:2012 Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-19: Tests - Damp heat (steady state)
IEC 60749-12:2002 Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency

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