IEC 61338-1-3:1999
Current
Current
The latest, up-to-date edition.
Waveguide type dielectric resonators - Part 1-3: General information and test conditions - Measurement method of complex relative permittivity for dielectric resonator materials at microwave frequency
Available format(s)
PDF
Language(s)
English - French
Published date
30-11-1999
Publisher
US$172.00
Excluding Tax where applicable
Describes the measurement methods of the complex relative permittivity of dielectric resonator materials at microwave frequencies by means of the dielectric rod resonator method short-circuited at both ends by parallel conducting plates.
| Committee |
TC 49
|
| DevelopmentNote |
Also numbered as BS EN 61338-1.3. (05/2005) Stability Date: 2017. (09/2017)
|
| DocumentType |
Standard
|
| Pages |
47
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Current
|
| Standards | Relationship |
| NF EN 61338-1-3 : 2000 | Identical |
| NEN EN IEC 61338-1-3 : 2000 | Identical |
| PN EN 61338-1-3 : 2002 | Identical |
| CEI EN 61338-1-3 : 2001 | Identical |
| EN 61338-1-3:2000 | Identical |
| DIN EN 61338-1-3:2000-10 | Identical |
| UNE-EN 61338-1-3:2000 | Identical |
| 13/30282586 DC : 0 | BS EN 61338-1-5 - WAVEGUIDE TYPE DIELECTRIC RESONATORS - PART 1-5:GENERAL INFORMATION AND TEST CONDITIONS - MEASUREMENT METHOD OF CONDUCTIVITY AT INTERFACE BETWEEN CONDUCTOR LAYER AND DIELECTRIC SUBSTRATE AT MICROWAVE FREQUENCY |
| BS EN 61338-2:2004 | Waveguide type dielectric resonators Guidelines for oscillator and filter applications |
| BS EN 61338-1:2005 | Waveguide type dielectric resonators Generic specification |
| CEI EN 61338-1-5 : 2016 | WAVEGUIDE TYPE DIELECTRIC RESONATORS - PART 1-5: GENERAL INFORMATION AND TEST CONDITIONS - MEASUREMENT METHOD OF CONDUCTIVITY AT INTERFACE BETWEEN CONDUCTOR LAYER AND DIELECTRIC SUBSTRATE AT MICROWAVE FREQUENCY |
| BS EN 61338-1-5:2015 | Waveguide type dielectric resonators General information and test conditions. Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency |
| 03/103741 DC : DRAFT FEB 2003 | IEC 61338-1 ED.1 - WAVEGUIDE TYPE DIELECTRIC RESONATORS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
| DD IEC PAS 61338-1-5 : DRAFT JULY 2010 | WAVEGUIDE TYPE DIELECTRIC RESONATORS - PART 1-5: GENERAL INFORMATION AND TEST CONDITIONS - MEASUREMENT METHOD OF CONDUCTIVITY AT INTERFACE BETWEEN CONDUCTOR LAYER AND DIELECTRIC SUBSTRATE AT MICROWAVE FREQUENCY |
| IEC 61338-2:2004 | Waveguide type dielectric resonators - Part 2: Guidelines for oscillator and filter applications |
| BS EN 61338-1-4:2006 | Waveguide type dielectric resonators General information and test conditions. Measurement method of complex relative permittivity for dielectric resonator materials at millimetre-wave frequency |
| IEC 61338-1-2:1998 | Waveguide type dielectric resonators - Part 1-2: General information and test conditions - Test conditions |
| I.S. EN 61338-1:2005 | WAVEGUIDE TYPE DIELECTRIC RESONATORS - PART 1: GENERIC SPECIFICATION |
| IEC 61338-1-4:2005 | Waveguide type dielectric resonators - Part 1-4: General information and test conditions - Measurement method of complex relative permittivity for dielectric resonator materials at millimetre-wave frequency |
| 03/103740 DC : DRAFT FEB 2003 | IEC 61337-1 ED.1 - FILTERS USING WAVEGUIDE TYPE DIELECTRIC RESONATORS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
| I.S. EN 61338-1-5:2015 | WAVEGUIDE TYPE DIELECTRIC RESONATORS - PART 1-5: GENERAL INFORMATION AND TEST CONDITIONS - MEASUREMENT METHOD OF CONDUCTIVITY AT INTERFACE BETWEEN CONDUCTOR LAYER AND DIELECTRIC SUBSTRATE AT MICROWAVE FREQUENCY |
| I.S. EN 61338-1-4:2006 | WAVEGUIDE TYPE DIELECTRIC RESONATORS - PART 1-4: GENERAL INFORMATION AND TEST CONDITIONS - MEASUREMENT METHOD OF COMPLEX RELATIVE PERMITTIVITY FOR DIELECTRIC RESONATOR MATERIALS AT MILLIMETRE-WAVE FREQUENCY |
| IEC PAS 61338-1-5:2010 | Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency |
| IEC 61338-1-5:2015 | Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency |
| IEC 61338-1:2004 | Waveguide type dielectric resonators - Part 1: Generic specification |
| IEC PAS 61338-2:2000 | Waveguide type dielectric resonators - Part 2: Guide to the use of waveguide type dielectric resonators |
| BS EN 170000:1999 | Harmonized system of quality assessment for electronic components. Generic specification: waveguide type dielectric resonators |
| EN 61338-1-4:2006/corrigendum:2006 | WAVEGUIDE TYPE DIELECTRIC RESONATORS - PART 1-4: GENERAL INFORMATION AND TEST CONDITIONS - MEASUREMENT METHOD OF COMPLEX RELATIVE PERMITTIVITY FOR DIELECTRIC RESONATOR MATERIALS AT MILLIMETRE-WAVE FREQUENCY |
| EN 61338-2:2004 | Waveguide type dielectric resonators - Part 2: Guidelines for oscillator and filter applications |
| EN 61338-1-5:2015 | Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency |
| EN 61338-1:2005 | Waveguide type dielectric resonators - Part 1: Generic specification |
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