UNE-EN 62374-1:2010
Current
Current
The latest, up-to-date edition.
Semiconductor devices -- Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers (Endorsed by AENOR in March of 2011.)
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
01-03-2011
Publisher
Important note : All end users must be registered with an Account prior to user licenses being assigned.| Committee |
CTN 209/SC 47
|
| DocumentType |
Standard
|
| Pages |
19
|
| ProductNote |
THIS STANDARD IS IDENTICAL TO EN 62374-1:2010
|
| PublisherName |
Asociacion Espanola de Normalizacion
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| EN 62374-1:2010 | Identical |
| EN 62374-1:2010/AC:2011 | Identical |
| IEC 62374-1:2010 | Identical |
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