UNE-EN 60255-11:2010
Superseded
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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Measuring relays and protection equipment - Part 11: Voltage dips, short interruptions, variations and ripple on auxiliary power supply port
Available format(s)
Hardcopy , PDF
Superseded date
29-06-2016
Superseded by
Language(s)
English, Spanish, Castilian
Published date
01-12-2010
Publisher
| Committee |
CTN 207/SC 94-95
|
| DevelopmentNote |
Supersedes UNE 21136-11. (12/2010)
|
| DocumentType |
Standard
|
| Pages |
16
|
| PublisherName |
Asociacion Espanola de Normalizacion
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
| Standards | Relationship |
| EN 60255-11:2010 | Identical |
| IEC 60255-11:2008 | Identical |
| SEMI F47 : 2006(R2012) | SPECIFICATION FOR SEMICONDUCTOR PROCESSING EQUIPMENT VOLTAGE SAG IMMUNITY |
| EN 61000-4-11:2004/A1:2017 | ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 4-11: TESTING AND MEASUREMENT TECHNIQUES - VOLTAGE DIPS, SHORT INTERRUPTIONS AND VOLTAGE VARIATIONS IMMUNITY TESTS (IEC 61000-4-11:2004/A1:2017) |
| IEC 61000-6-2:2016 | Electromagnetic compatibility (EMC) - Part 6-2: Generic standards - Immunity standard for industrial environments |
| IEC 60050-151:2001 | International Electrotechnical Vocabulary (IEV) - Part 151: Electrical and magnetic devices |
| IEC 61000-4-11:2004+AMD1:2017 CSV | Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests |
| IEC 61000-4-17:1999+AMD1:2001+AMD2:2008 CSV | Electromagnetic compatibility (EMC) - Part 4-17: Testing and measurement techniques - Ripple on d.c. input power port immunity test |
| EN 60255-6 : 94 AC 95 | ELECTRICAL RELAYS - MEASURING RELAYS AND PROTECTION EQUIPMENT |
| IEC 60255-6:1988 | Electrical relays - Part 6: Measuring relays and protection equipment |
| IEC 61000-4-29:2000 | Electromagnetic compatibility (EMC) - Part 4-29: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations on d.c. input power port immunity tests |
| EN 61000-4-17:1999/A2:2009 | ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 4-17: TESTING AND MEASUREMENT TECHNIQUES - RIPPLE ON D.C. INPUT POWER PORT IMMUNITY TEST |
| EN 61000-4-29:2000 | Electromagnetic compatibility (EMC) - Part 4-29: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations on d.c. input power port immunity tests |
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