SN EN 14784-1 : 2005
Current
The latest, up-to-date edition.
NON-DESTRUCTIVE TESTING - INDUSTRIAL COMPUTED RADIOGRAPHY WITH STORAGE PHOSPHOR IMAGING PLATES - PART 1: CLASSIFICATION OF SYSTEMS
12-01-2013
Foreword
1 Scope
2 Normative references
3 Terms and definitions
4 Personnel qualification
5 CR quality indicators
6 Procedure for quantitative measurement of image quality
parameters
7 CR System Classification and Interpretation of Results
Annex A (informative) Example for I[IPx] measurement
Annex B (informative) Example of CR test phantom
Annex C (informative) Guidance for application of various
tests and test methods
Bibliography
Describes fundamental parameters of computed radiography systems with the aim of enabling satisfactory and repeatable results to be obtained economically.
DocumentType |
Standard
|
PublisherName |
Swiss Standards
|
Status |
Current
|
Standards | Relationship |
UNE-EN 14784-1:2006 | Identical |
EN 14784-1:2005 | Identical |
UNI EN 14784-1 : 2006 | Identical |
BS EN 14784-1:2005 | Identical |
DIN EN 14784-1:2005-11 | Identical |
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