MIL-STD-883-4 Base Document:2019
Current
The latest, up-to-date edition.
Electrical Tests (Linear) for Microcircuits Part 4: Test Methods 4000-4999
English
16-09-2019
Part 3 of this test method standard establishes uniform test methods for the electrical testing (digital) to determine resistance to deleterious effects of natural elements and conditions surrounding military operations.
| DocumentType |
Standard
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| Pages |
43
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| ProductNote |
This standard is also refers to:-MIL-PRF-35835,IPC J-STD-004,IPC J-STD-005,IPC J-STD-006,IPC J-STD-033,IPC-T-50,SAE AMS-STD-595/15102,SAE AMS-STD-595/25102.
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| PublisherName |
US Military Specs/Standards/Handbooks
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| Status |
Current
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| Supersedes |
Part 3 of this test method standard establishes uniform test methods for the electrical testing (digital) to determine resistance to deleterious effects of natural elements and conditions surrounding military operations. For the purpose of this standard, the term \"devices\" includes such items as monolithic, multichip, film and hybrid microcircuits, microcircuit arrays, and the elements from which the circuits and arrays are formed. This standard is intended to apply only to microelectronic devices.
| DSCC 88695C:2023 | MICROCIRCUIT, DIGITAL, BIPOLAR ADVANCED LOW POWER SCHOTTKY TTL, 2-INPUT AND DRIVERS, MONOLITHIC SILICON |
| DSCC 94536G:2024 | MICROCIRCUIT, HYBRID, LINEAR, 11.8-VOLT, SYNCHRO AND RESOLVER TO DIGITAL CONVERTER |
| DSCC 77020H:2024 | MICROCIRCUIT, DIGITAL, CMOS, STROBED DRAWING APPROVAL DATE HEX INVERTER/BUFFER, MONOLITHIC SILICON |
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