MIL-STD-883-3 Base Document:2019
Current
The latest, up-to-date edition.
Electrical Tests (Digital) for Microcircuits Part 3: Test Methods 3000-3999
English
16-09-2019
Part 3 of this test method standard establishes uniform test methods for the electrical testing (digital) to determine resistance to deleterious effects of natural elements and conditions surrounding military operations.
| DocumentType |
Standard
|
| Pages |
89
|
| PublisherName |
US Military Specs/Standards/Handbooks
|
| Status |
Current
|
| Supersedes |
Part 3 of this test method standard establishes uniform test methods for the electrical testing (digital) to determine resistance to deleterious effects of natural elements and conditions surrounding military operations. For the purpose of this standard, the term \"devices\" includes such items as monolithic, multichip, film and hybrid microcircuits, microcircuit arrays, and the elements from which the circuits and arrays are formed. This standard is intended to apply only to microelectronic devices.
| DSCC 93118E:2024 | MICROCIRCUIT, DIGITAL, ADVANCED CMOS, SERIALLY CONTROLLED ACCESS NETWORK, TRANSPARENT LATCH WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON |
| DSCC 98615C:2024 | Microcircuit, Memory, Digital, Radiation Hardened CMOS, Low Voltage, 128K x 8-Bit Static Ram, Monolithic Silicon |
| DSCC 12233D:2024 | MICROCIRCUIT, LINEAR, HIGH VOLTAGE AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 14-02-20 BIDIRECTIONAL CURRENT SHUNT MONITOR, MONOLITHIC SILICON |
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