MIL-PRF-19500-767 Revision C:2016
Current
The latest, up-to-date edition.
Transistor, NPN, Silicon, Low-Power, Type 2N5551, Encapsulated (Surface Mount Packages) and Unencapsulated, Radiation Hardness Assurance, Quality Levels JAN, JANTX, JANTXV, JANS, JANHC, and JANKC
English
08-04-2016
1. SCOPE
2. APPLICABLE DOCUMENTS
3. REQUIREMENTS
4. VERIFICATION
5. PACKAGING
6. NOTES
Describes the performance requirements for NPN silicon, low-power transistors.
| DocumentType |
Standard
|
| Pages |
19
|
| PublisherName |
US Military Specs/Standards/Handbooks
|
| Status |
Current
|
This specification covers the performance requirements for NPN silicon, low-power transistors. Four levels of product assurance (JAN, JANTX, JANTXV, and JANS) are provided for each device type as specified in MIL-PRF-19500 and two levels of product assurance (JANHC and JANKC) are provided for each unencapsulated type die. Provision for radiation hardness assurance RHA level designators \"M\", \"D\", \"P\", \"L\", \"R\", \"F\", \"G\", and \"H\" are appended to the device prefix to identify devices which have passed RHA requirements.
| MIL-PRF-19500 Revision P:2010 | Semiconductor Devices, General Specification for |
| MIL-STD-750 Revision F:2011 | Test Methods for Semiconductor Devices |
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