MIL-PRF-19500-382 Revision L:2017
Current
The latest, up-to-date edition.
Transistor, PNP, Silicon, Low-Power, Encapsulated (Through-Hole and Surface Mount), and Unencapsulated, Radiation Hardness Assurance, Device Types 2N2944A, 2N2945A, 2N2946A, Quality Levels: JAN, JANTX, JANTXV, JANS, JANHC,and JANKC
14-04-2017
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1. SCOPE
2. APPLICABLE DOCUMENTS
3. REQUIREMENTS
4. VERIFICATION
5. PACKAGING
6. NOTES
Specifies the performance requirements for low-power, PNP, silicon 2N2944A, 2N2945A, 2N2946A transistors for use in high-speed, switching and general purpose amplifier applications.
| DevelopmentNote |
Supersedes MIL S 19500/382 (B) (02/2000)
|
| DocumentType |
Standard
|
| Pages |
64
|
| PublisherName |
US Military Specs/Standards/Handbooks
|
| Status |
Current
|
| Supersedes |
This specification covers the performance requirements for low-power, PNP, silicon transistors for use in high-speed, switching and general purpose amplifier applications. A \'M\' and UB \'M\' suffix will indicate a matched pair. Four levels of product assurance are provided for each encapsulated device type as specified in MIL-PRF-19500, and two levels of product assurance are provided for each unencapsulated device type. Provisions for radiation hardness assurance (RHA) to eight radiation levels is provided for quality levels JANTX, JANS, JANHC, and JANKC. RHA level designators \"M\", \"D\", \"P\", \"L\", \"R\", \"F\", \"G\", and \"H\" are appended to the device prefix to identify devices, which have passed RHA requirements.
| MIL-PRF-19500 Revision P:2010 | SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR |
| MIL-STD-750 Revision F:2011 | TEST METHODS FOR SEMICONDUCTOR DEVICES |
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