MIL-M-55565 Revision C:1988
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
MICROCIRCUITS, PACKAGING OF
15-08-2001
1. SCOPE
2. APPLICABLE DOCUMENTS
3. REQUIREMENTS
4. QUALITY ASSURANCE PROVISIONS
5. PACKAGING
6. NOTES
Outlines requirements for preservation, packing, and container marking of microcircuits.
Committee |
FSC PACK
|
DevelopmentNote |
C NOTICE 1 - Notice of Cancellation/Superseded by MIL STD 2073/1 (03/2004)
|
DocumentType |
Standard
|
Pages |
14
|
PublisherName |
US Military Specs/Standards/Handbooks
|
Status |
Superseded
|
SupersededBy |
MIL-M-63530 Base Document:1982 | MICROCIRCUIT, DIGITAL, CMOS (LOGIC) |
MIL-E-17555 Revision H:1984 | ELECTRONIC AND ELECTRICAL EQUIPMENT, ACCESSORIES, AND PROVISIONED ITEMS (REPAIR PARTS); PACKAGING OF |
MIL-P-9024 Revision G:1972 | PACKAGING, MATERIALS HANDLING AND TRANSPORTABILITY, SYSTEM AND SYSTEM SEGMENTS GENERAL SPECIFICATION FOR |
MIL I 38535 : B (1) | INTEGRATED CIRCUITS (MICROCIRCUITS) MANUFACTURING, GENERAL SPECIFICATION FOR |
MIL-M-38510 Revision J:1991 | MICROCIRCUITS, SPECIFICATION FOR |
MIL-STD-726 Revision H:1985 | PACKAGING REQUIREMENTS CODE |
MIL-I-48632 Base Document:1986 | INTEGRATED CIRCUIT, DIGITAL CMOS CONTROL AND TIMING BASE, MONOLITHIC, SILICON |
MIL-S-49433 Base Document:1984 | SURFACE ACOUSTIC WAVE DEVICES, GENERAL SPECIFICATION FOR |
MIL-M-63323 Revision A:1981 | MICROCIRCUIT, LINEAR, VOLTAGE COMPARATORS |
MIL M 64020D : 1989 | MICROCIRCUIT, AMPLIFIER, BIPOLAR, HIGH FREQUENCY, FRONT END |
MIL D 83532 : A (3) SUPP 1 | DELAY LINES, ACTIVE |
MIL-M-48646 Base Document:1986 | MICROCIRCUIT, DIGITAL, SCO/DLA MULTICHIP CMOS |
MIL-M-63324 Revision A:1981 | MICROCIRCUIT, DIGITAL, CMDS, SPECIAL PURPOSE NOR GATE |
MIL-I-48634 Base Document:1986 | INTEGRATED CIRCUIT, DIGITAL, CMOS LOGIC ARRAY MONOLITHIC, SILICON |
MIL C 83446 : B | COIL, RADIO FREQUENCY, CHIP, FIXED OR VARIABLE, GENERAL SPECIFICATION FOR |
MIL-M-63321 Revision A:1981 | MICROCIRCUIT, DIGITAL, CMOS (FINAL LOGIC) |
MIL-F-48370 Revision A:1985 | FUZE M934E6, HYBRID MICROCIRCUITS FOR |
MIL-I-48331 Revision A:1979 | INTEGRATED CIRCUIT, DIGITAL, CMOS, TIME BASE AND SPECIAL PURPOSE FUNCTION GENERATOR, MONOLITHIC, SILICON |
MIL-A-63242 Revision A:1982 | AMPLIFIER, OPERATIONAL TRIPLE PROGRAMMABLE MICROPOWER |
MIL-M-48647 Base Document:1986 | MICROCIRCUIT, DIGITAL, DECODER, LOGIC ARRAY |
MIL-M-63320 Revision A:1981 | MICROCIRCUIT, DIGITAL, CMOS (INITIAL LOGIC) |
MIL-STD-1331 Base Document:1969 | PARAMETER TO BE CONTROLLED FOR THE SPECIFICATION OF MICROCIRCUITS |
PPP-C-1752 Revision D:1989 | CUSHIONING MATERIAL, PACKAGING, POLYETHYLENE FOAM |
MIL-B-117G:1993 | BAG, SLEEVE AND TUBING |
MIL-STD-129 Revision R:2014 | Military Marking for Shipment and Storage |
MIL D 83532 : A (3) SUPP 1 | DELAY LINES, ACTIVE |
MIL-STD-883 Revision K:2016 | TEST METHOD STANDARD - MICROCIRCUITS |
PPP-B-636 Revision J:1981 | BOX, SHIPPING, FIBERBOARD |
MIL B 81705 : C | BARRIER MATERIALS, FLEXIBLE, ELECTROSTATIC FREE HEAT SEALABLE |
MIL-STD-2073-1 Revision E:2008 | STANDARD PRACTICE FOR MILITARY PACKAGING |
PPP-B-566 Revision E:1974 | BOX, FOLDING, PAPERBOARD |
MIL-STD-45662 Revision A:1988 | CALIBRATION SYSTEMS REQUIREMENTS |
QQ-S-781 Revision H:1974 | STRAPPING, STEEL, AND SEALS |
MIL-M-38510 Revision J:1991 | MICROCIRCUITS, SPECIFICATION FOR |
PPP-C-1797 Revision A:1982 | CUSHIONING MATERIAL, RESILIENT, LOW DENSITY, UNICELLULAR POLYPROPYLENE FOAM |
PPP-C-795 Revision D:1994 | Cushioning Material, Closed Cell Flexible, Plastic Film |
FED-STD-123 Revision H:2007 | MARKING FOR SHIPMENT (CIVIL AGENCIES) |
PPP-B-676 Revision E:1992 | BOXES SET-UP |
MIL-STD-794 Revision E:1982 | PART AND EQUIPMENT, PROCEDURES FOR PACKAGING AND PACKING OF |
MIL-P-116 Revision J:1988 | PRESERVATION, METHODS OF |
PPP-B-601 Revision H:1989 | BOXES, WOOD, CLEATED PLYWOOD |
PPP-B-621 Revision D:1981 | BOXES, WOOD, NAILED AND LOCK CORNER |
PPP-C-1842 Revision B:1992 | CUSHIONING MATERIAL, PLASTIC, OPEN CELL (FOR PACKAGING APPLICATIONS) |
MIL-STD-105 Revision E:1989 | SAMPLING PROCEDURES AND TABLES FOR INSPECTION BY ATTRIBUTES |
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