JIS C 1000-4-11:2003
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The latest, up-to-date edition.
Electromagnetic Compatibility (emc) - Part 4: Testing And Measuring Techniques - Section 11: Voltage Dips, Short Interruptions And Voltage Variations Immunity Tests
Available format(s)
Hardcopy
Language(s)
Japanese
Published date
20-03-2003
Publisher
| DocumentType |
Standard
|
| Pages |
0
|
| ProductNote |
Redesignated by JIS C61000-4-11. (10/2005)
|
| PublisherName |
Japanese Standards Association
|
| Status |
Current
|
| SupersededBy |
2003 [20/03/2003]
| JIS C 0161:1997 | International Electrotechnical Vocabulary: Electromagnetic Compatibility |
| JIS C 1000-6-1:2003 | Electromagnetic Compatibility (emc) - Part 6: Generic Standards - Section 1: Immunity For Residential, Commercial And Light-industrial Environments |
| JIS TR C0025:2002 | Electromagnetic Compatibility (emc) - Part 4: Testing And Measurement Techniques - Section 15: Flickermeter - Functional And Design Specifications |
| JIS C 1000-6-2:2003 | Electromagnetic Compatibility (emc) - Part 6: Generic Standards - Section 2: Immunity For Industrial Environments |
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