JEDEC JESD 57A:2017
Current
Current
The latest, up-to-date edition.
TEST PROCEDURE FOR THE MANAGEMENT OF SINGLE-EVENT EFFECTS IN SEMICONDUCTOR DEVICES FROM HEAVY ION IRRADIATION:
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
01-11-2017
Publisher
This test method defines the requirements and procedures for single-event effects (SEE) testing of analog and/or digital discrete semiconductor devices and integrated circuits by irradiation with energetic heavy ions.
| DocumentType |
Test Method
|
| Pages |
56
|
| PublisherName |
JEDEC Solid State Technology Association
|
| Status |
Current
|
| Supersedes |
| DSCC V62/22614:2022 | MICROCIRCUIT, DIGITAL-LINEAR, 12-BIT ANALOG MONITORING AND CONTROL SOLUTION WITH MULTICHANNEL ADC, DACs. AND TEMPERATURE SENSORS, MONOLITHIC SILICON |
| DSCC V62/18621:2022 | MICROCIRCUIT, DIGITAL, MICROCONTROLLER,MONOLITHIC SILICON |
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