ISO 18257:2016
Current
Current
The latest, up-to-date edition.
Space systems — Semiconductor integrated circuits for space applications — Design requirements
Available format(s)
Hardcopy , PDF 1 User , PDF 3 Users , PDF 5 Users , PDF 9 Users
Language(s)
English
Published date
17-11-2016
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ISO 18257:2016 specifies the basic design requirements for semiconductor ICs for space applications, including its design process, as well as required tasks and requirements of each stage. Requirements of specific circuit design are not included.
| DevelopmentNote |
Supersedes ISO/DIS 18257. (11/2016)
|
| DocumentType |
Standard
|
| Pages |
24
|
| ProductNote |
THIS STANDARD ALSO REFERES TO : IEC 62132
|
| PublisherName |
International Organization for Standardization
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| Status |
Current
|
| Standards | Relationship |
| ABNT NBR ISO 18257:2023 | Identical |
| BS ISO 18257:2016 | Identical |
| IEC 61967-2:2005 | Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method |
| IEC 62215-3:2013 | Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method |
| ISO 10795:2011 | Space systems Programme management and quality Vocabulary |
| IEEE 1149.1-2013 REDLINE | IEEE Standard for Test Access Port and Boundary-Scan Architecture |
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