ISO 16700:2016
Current
Current
The latest, up-to-date edition.
Microbeam analysis — Scanning electron microscopy — Guidelines for calibrating image magnification
Available format(s)
Hardcopy , PDF 1 User , PDF 3 Users , PDF 5 Users , PDF 9 Users
Language(s)
English
Published date
18-07-2016
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ISO 16700:2016 specifies a method for calibrating the magnification of images generated by a scanning electron microscope (SEM) using an appropriate reference material. This method is limited to magnifications determined by the available size range of structures in the calibrating reference material. It does not apply to the dedicated critical dimension measurement SEM.
| Committee |
ISO/TC 202/SC 4
|
| DevelopmentNote |
Supersedes ISO/DIS 16700. (07/2016)
|
| DocumentType |
Standard
|
| Pages |
18
|
| PublisherName |
International Organization for Standardization
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| JIS K 0149-1:2019 | Identical |
| BS ISO 16700:2004 | Identical |
| NEN ISO 16700 : 2016 | Identical |
| NF ISO 16700 : 2006 | Identical |
| SAC GB/T 27788 : 2011 | Identical |
| BS ISO 16700:2016 | Identical |
| DD ISO/TS 12805:2011 | Nanotechnologies. Materials specifications. Guidance on specifying nano-objects |
| DIN ISO 22309:2015-11 | MICROBEAM ANALYSIS - QUANTITATIVE ANALYSIS USING ENERGY-DISPERSIVE SPECTROMETRY (EDS) FOR ELEMENTS WITH AN ATOMIC NUMBER OF 11 (NA) OR ABOVE (ISO 22309:2011) |
| PD IEC/TS 62622:2012 | Nanotechnologies. Description, measurement and dimensional quality parameters of artificial gratings |
| EN 1071-10:2009 | Advanced technical ceramics - Methods of test for ceramic coatings - Part 10: Determination of coating thickness by cross sectioning |
| BS ISO 22309:2011 | Microbeam analysis. Quantitative analysis using energy-dispersive spectrometry (EDS) for elements with an atomic number of 11 (Na) or above |
| 08/30185924 DC : 0 | BS EN 1071-10 - ADVANCED TECHNICAL CERAMICS - METHODS OF TEST FOR CERAMIC COATINGS - PART 10: DETERMINATION OF COATING THICKNESS BY CROSS SECTIONING |
| PD ISO/TR 18196:2016 | Nanotechnologies. Measurement technique matrix for the characterization of nano-objects |
| NF ISO 22309 : 2012 | MICROBEAM ANALYSIS - QUANTITATIVE ANALYSIS USING ENERGY-DISPERSIVE SPECTROMETRY (EDS) FOR ELEMENTS WITH AN ATOMIC NUMBER OF 11 (NA) OR ABOVE |
| S.R. CWA 17253-1:2018 | JOINT IMPLANTS - PART 1: NOVEL METHODS FOR ISOLATING WEAR PARTICLES FROM JOINT REPLACEMENTS AND RELATED DEVICES |
| NF ISO 13067 : 2012 | MICROBEAM ANALYSIS - ELECTRON BACKSCATTER DIFFRACTION - MEASUREMENT OF AVERAGE GRAIN SIZE |
| ISO/TS 10798:2011 | Nanotechnologies — Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis |
| ASTM D 8128 : 2017 | Standard Guide for Monitoring Failure Mode Progression in Industrial Applications with Rolling Element Ball Type Bearings |
| ISO 22309:2011 | Microbeam analysis — Quantitative analysis using energy-dispersive spectrometry (EDS) for elements with an atomic number of 11 (Na) or above |
| BS ISO 13067:2011 | Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size |
| ISO/TS 24597:2011 | Microbeam analysis — Scanning electron microscopy — Methods of evaluating image sharpness |
| UNI EN 1071-10 : 2009 | ADVANCED TECHNICAL CERAMICS - METHODS OF TEST FOR CERAMIC COATINGS - PART 10: DETERMINATION OF COATING THICKNESS BY CROSS SECTIONING |
| ISO/TS 12805:2011 | Nanotechnologies — Materials specifications — Guidance on specifying nano-objects |
| I.S. EN 1071-10:2009 | ADVANCED TECHNICAL CERAMICS - METHODS OF TEST FOR CERAMIC COATINGS - PART 10: DETERMINATION OF COATING THICKNESS BY CROSS SECTIONING |
| IEC TS 62622:2012 | Nanotechnologies - Description, measurement and dimensional quality parameters of artificial gratings |
| DD ISO/TS 10798 : DRAFT JULY 2011 | NANOTECHNOLOGIES - CHARACTERIZATION OF SINGLEWALL CARBON NANOTUBES USING SCANNING ELECTRON MICROSCOPY AND ENERGY DISPERSIVE X-RAY SPECTROMETRY ANALYSIS |
| BS EN 1071-10:2009 | Advanced technical ceramics. Methods of test for ceramic coatings Determination of coating thickness by cross sectioning |
| DIN ISO 13067:2015-12 | Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size (ISO 13067:2011) |
| ISO/TR 10993-22:2017 | Biological evaluation of medical devices — Part 22: Guidance on nanomaterials |
| ISO 29301:2017 | Microbeam analysis — Analytical electron microscopy — Methods for calibrating image magnification by using reference materials with periodic structures |
| ISO 13067:2011 | Microbeam analysis Electron backscatter diffraction Measurement of average grain size |
| ISO/TR 18196:2016 | Nanotechnologies — Measurement technique matrix for the characterization of nano-objects |
| 08/30138435 DC : DRAFT SEP 2008 | BS ISO 24597 - MICROBEAM ANALYSIS - SCANNING ELECTRON MICROSCOPY - METHODS FOR THE EVALUATION OF IMAGE SHARPNESS |
| PD ISO/TR 10993-22:2017 | Biological evaluation of medical devices Guidance on nanomaterials |
| BS ISO 29301:2017 | Microbeam analysis. Analytical electron microscopy. Methods for calibrating image magnification by using reference materials with periodic structures |
| DIN EN 1071-10:2009-10 | Advanced technical ceramics - Methods of test for ceramic coatings - Part 10: Determination of coating thickness by cross sectioning |
| XP ISO/TS 24597 : 2011 XP | MICROBEAM ANALYSIS - SCANNING ELECTRON MICROSCOPY - METHODS OF EVALUATING IMAGE SHARPNESS |
| ISO/IEC 17025:2005 | General requirements for the competence of testing and calibration laboratories |
| ISO 5725-1:1994 | Accuracy (trueness and precision) of measurement methods and results — Part 1: General principles and definitions |
| ISO Guide 35:2017 | Reference materials — Guidance for characterization and assessment of homogeneity and stability |
| ISO Guide 30:2015 | Reference materials — Selected terms and definitions |
| ISO Guide 34:2009 | General requirements for the competence of reference material producers |
| ISO/IEC Guide 98-3:2008 | Uncertainty of measurement — Part 3: Guide to the expression of uncertainty in measurement (GUM:1995) |
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