IEC TS 62228:2007
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
Integrated circuits - EMC evaluation of CAN transceivers
Hardcopy , PDF 1 User , PDF 3 Users , PDF 5 Users , PDF 9 Users
31-12-2021
English
16-02-2007
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FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 Measurements and tests
4.1 General
4.2 RF and transient tests
4.3 ESD
5 Test report
Annex A (informative) Test circuit boards
Annex B (informative) Documentation of test results
Bibliography
Specifies test and measurement methods, test conditions, test setups, test procedures, failure criteria and test signals for the EMC evaluation of CAN transceivers concerning: - immunity against RF common mode disturbances on the signal lines - emissions caused by non-symmetrical signals regarding the time and frequency domain - immunity against transients (function and damage) - immunity against electrostatic discharges - ESD (damage)
| DevelopmentNote |
Stability Date: 2015. (10/2012)
|
| DocumentType |
Technical Specification
|
| Pages |
44
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Superseded
|
| Standards | Relationship |
| NEN NPR IEC/TS 62228 : 2007 | Identical |
| DD IEC/TS 62228:2007 | Identical |
| IEC 61967-1:2002 | Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions |
| IEC 62132-4:2006 | Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method |
| ISO 7637-2:2011 | Road vehicles Electrical disturbances from conduction and coupling Part 2: Electrical transient conduction along supply lines only |
| IEC 62132-1:2015 | Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions |
| IEC 61967-4:2002+AMD1:2006 CSV | Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 Ω/150 Ω direct coupling method |
| IEC 61000-4-2:2008 | Electromagnetic compatibility (EMC) - Part 4-2: Testing and measurement techniques - Electrostatic discharge immunity test |
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