IEC 62429:2007
Current
The latest, up-to-date edition.
Reliability growth - Stress testing for early failures in unique complex systems
Hardcopy , PDF 1 User , PDF 3 Users , PDF 5 Users , PDF 9 Users
English - French, Spanish, Castilian
30-11-2007
FOREWORD
1 Scope
2 Normative references
3 Terms, definitions, abbreviations and symbols
3.1 Terms and definitions
3.2 Acronyms
3.3 Symbols
4 General
5 Planning and performing a reliability growth test
5.1 Step 1 - Should a reliability growth test be used?
5.2 Step 2 - Failure definitions and data collection
5.3 Step 3 - Stress levels
5.3.1 General
5.3.2 Increased operating load
5.3.3 Increased environmental stress
5.4 Step 4 - Failure analysis and classification of failures
5.4.1 General
5.4.2 Relevant failures
5.4.3 Non-relevant failures
5.5 Step 5 - Stop criteria
5.5.1 General
5.5.2 Method 1 - Fixed testing programs
5.5.3 Method 2 - Graphical analysis
5.5.4 Method 3 - Success ratio test
5.5.5 Method 4 - Estimation of reliability
5.5.6 Method 5 - Comparison with acceptable instantaneous
failure intensity
5.5.7 Method 6 - Estimation of remaining latent faults
5.5.8 Method 7 - Reliability indicator testing
5.6 Step 6 - Verification of repairs and reliability growth
5.7 Step 7 - Reporting and feedback.
Annex A (informative) Practical example of method 3 - Success
ratio test
Annex B (informative) Practical example of method 5 - Comparison
with acceptable instantaneous failure
intensity
Annex C (informative) Practical example of method 6 - Estimation
of remaining latent faults
Bibliography
This International Standard gives guidance for reliability growth during final testing or acceptance testing of unique complex systems. It gives guidance on accelerated test conditions and criteria for stopping these tests.
DevelopmentNote |
Stability Date: 2023. (09/2017)
|
DocumentType |
Standard
|
Pages |
71
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PublisherName |
International Electrotechnical Committee
|
Status |
Current
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Standards | Relationship |
NF EN 62429 : 2008 | Identical |
NEN EN IEC 62429 : 2008 | Identical |
I.S. EN 62429:2008 | Identical |
PN EN 62429 : 2008 | Identical |
BS EN 62429:2008 | Identical |
UNE-EN 62429:2012 | Identical |
CEI EN 62429 : 2008 | Identical |
EN 62429:2008 | Identical |
DIN EN 62429:2008-08 | Identical |
UNE-EN 62429:2008 | Identical |
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MIL-HDBK-2164 Revision A:1996 | ENVIRONMENTAL STRESS SCREENING PROCESS FOR ELECTRONIC EQUIPMENT |
MIL-HDBK-344 Revision A:1993 | ENVIRONMENTAL STRESS SCREENING (ESS) OF ELECTRONIC EQUIPMENT |
IEC 61163-1:2006 | Reliability stress screening - Part 1: Repairable assemblies manufactured in lots |
IEC 61163-2:1998 | Reliability stress screening - Part 2: Electronic components |
BS 5760-8:1998 | Reliability of systems, equipment and components Guide to assessment of reliability of systems containing software |
IEC 60300-3-1:2003 | Dependability management - Part 3-1: Application guide - Analysis techniques for dependability - Guide on methodology |
IEC 61164:2004 | Reliability growth - Statistical test and estimation methods |
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IEC 60605-2:1994 | Equipment reliability testing - Part 2: Design of test cycles |
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IEST RP PR001.1 : 2003 | MANAGEMENT AND TECHNICAL GUIDELINES FOR THE ESS PROCESS |
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IEC 60300-3-5:2001 | Dependability management - Part 3-5: Application guide - Reliability test conditions and statistical test principles |
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