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IEC 61671-2:2016

Current

Current

The latest, up-to-date edition.

Standard for automatic test markup language (ATML) instrument description

Available format(s)

Hardcopy , PDF 1 User , PDF 3 Users , PDF 5 Users , PDF 9 Users

Language(s)

English

Published date

08-04-2016

$508.82
Including GST where applicable

1 Overview
2 Normative references
3 Definitions, abbreviations, and acronyms
4 InstrumentDescription schema
5 InstrumentDescription instance schema
6 ATML InstrumentDescription XML schema
  names and locations
7 ATML XML schema extensibility
8 Conformance
Annex A (informative) - IEEE download Web site material
        associated with this document
Annex B (informative) - Users information and examples
Annex C (informative) - Glossary
Annex D (informative) - Bibliography
Annex E (informative) - IEEE List of Participants

IEC 61671-2:2016(E) defines an exchange format, utilizing extensible markup language (XML), for both the static description of instrument models, and the specific description of instrument instance information.

DevelopmentNote
Also numbered as IEEE 1671.2. Stability date: 2021. (04/2016)
DocumentType
Standard
Pages
42
PublisherName
International Electrotechnical Committee
Status
Current

Standards Relationship
BS IEC 61671-2:2016 Identical
NEN IEC 61671-2 : 2016 Identical
BS EN 61000-4-4:2012 Identical

IEEE 1057-2007 REDLINE IEEE Standard for Digitizing Waveform Recorders
IEEE 1155 : 1992 VMEBUS EXTENSIONS FOR INSTRUMENTATION: VXIBUS
TIA 232 : F1997(R2012) INTERFACE BETWEEN DATA TERMINAL EQUIPMENT AND DATA CIRCUIT-TERMINATING EQUIPMENT EMPLOYING SERIAL BINARY DATA INTERCHANGE
IEEE 802.3-2012 IEEE Standard for Ethernet
IEEE 1671.6-2015 IEEE Standard for Automatic Test Markup Language (ATML) Test Station Description
IEEE 260.1 : 2004 LETTER SYMBOLS FOR UNITS OF MEASUREMENT (SI UNITS, CUSTOMARY INCH-POUND UNITS, AND CERTAIN OTHER UNITS)
MIL-PRF-55310 Revision E:2006 OSCILLATOR, CRYSTAL CONTROLLED, GENERAL SPECIFICATION FOR
MIL-STD-1309 Revision D:1992 DEFINITIONS OF TERMS FOR TEST, MEASUREMENT AND DIAGNOSTIC EQUIPMENT

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