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IEC 61261-2:1994

Current

Current

The latest, up-to-date edition.

Piezoelectric ceramic filters for use in electronic equipment - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 2: Sectional specification - Qualification approval

Available format(s)

Hardcopy , PDF 1 User , PDF 3 Users , PDF 5 Users , PDF 9 Users

Language(s)

English - French

Published date

11-03-1994

$292.11
Including GST where applicable

Prescribes preferred ratings and characteristics and selects from the Generic Specification (IEC 61261-1) the appropriate Quality Assessment procedures, tests and measuring methods and gives general performance requirements for this type of filter.

Committee
TC 49
DevelopmentNote
Stability Date: 2017. (09/2017)
DocumentType
Standard
Pages
43
PublisherName
International Electrotechnical Committee
Status
Current

BS EN 60368-2-2:1999 Piezoelectric filters. Guide to the use of piezoelectric filters Piezoelectric ceramic filters
BS EN 62047-7:2011 Semiconductor devices. Micro-electromechanical devices MEMS BAW filter and duplexer for radio frequency control and selection
I.S. EN 62047-7:2011 SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 7: MEMS BAW FILTER AND DUPLEXER FOR RADIO FREQUENCY CONTROL AND SELECTION
IEC 62047-7:2011 Semiconductor devices - Micro-electromechanical devices - Part 7: MEMS BAW filter and duplexer for radio frequency control and selection
08/30172394 DC : DRAFT APR 2008 BS EN 62047-7 - SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 7: MEMS FBAR FILTER & DUPLEXER
CEI EN 62047-7 : 2012 SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 7: MEMS BAW FILTER AND DUPLEXER FOR RADIO FREQUENCY CONTROL AND SELECTION
I.S. EN 60368-2-2:1999 PIEZOELECTRIC FILTERS - PART 2: GUIDE TO THE USE OF PIEZOELECTRIC FILTERS - SECTION 2: PIEZOELECTRIC CERAMIC FILTERS
IEC 61261-2-1:1994 Piezoelectric ceramic filters for use in electronic equipment - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 2: Sectional specification - Qualification approval - Section 1: Blank detail specification - Assessment level E
EN 60368-2-2:1999 Piezoelectric filters - Part 2: Guide to the use of piezoelectric filters - Section 2: Piezoelectric ceramic filters
EN 62047-7:2011 Semiconductor devices - Micro-electromechanical devices - Part 7: MEMS BAW filter and duplexer for radio frequency control and selection

ISO 3:1973 Preferred numbers — Series of preferred numbers
IEC 60368-1:2000+AMD1:2004 CSV Piezoelectric filters of assessed quality - Part 1: Genericspecification
IEC 61261-1:1994 Piezoelectric ceramic filters for use in electronic equipment - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 1: Generic specification - Qualification approval

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$292.11
Including GST where applicable