IEC 61178-3-1:1993
Current
Current
The latest, up-to-date edition.
Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 3: Sectional specification - Qualification approval - Section 1: Blank detail specification
Available format(s)
Hardcopy , PDF 1 User , PDF 3 Users , PDF 5 Users , PDF 9 Users
Language(s)
English - French
Published date
31-03-1993
Publisher
Supplementary document to the sectional specification. Contains requirements for style, layout and minimum content of detail specifications.
| Committee |
TC 49
|
| DevelopmentNote |
Supersedes IEC 122 PT1 (03/2001) Stability Date: 2017. (09/2017)
|
| DocumentType |
Standard
|
| Pages |
17
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Current
|
| Standards | Relationship |
| DIN IEC 61178-3-1:1995-02 | Identical |
| SAC GB/T 12273-501 : 2012 | Identical |
| NEN IEC 61178-3-1 : 1999 | Identical |
| IEC 60122-3:2010 | Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections |
| I.S. EN 60122-3:2010 | QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 3: STANDARD OUTLINES AND LEAD CONNECTIONS |
| BS EN 60122-3:2010 | Quartz crystal units of assessed quality Standard outlines and lead connections |
| IEC 61178-3:1993 | Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 3: Sectional specification - Qualification approval |
| 09/30200785 DC : 0 | BS EN 60122-3 - QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 3: STANDARD OUTLINES AND LEAD CONNECTIONS |
| EN 60122-3:2010 | Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections |
| IEC 60122-3:2010 | Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections |
| IEC 61178-3:1993 | Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 3: Sectional specification - Qualification approval |
| IECQ 001004:2006 | |
| IEC 60410:1973 | Sampling plans and procedures for inspection by attributes |
| IEC 61178-1:1993 | Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 1: Generic specification |
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