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IEC 60748-2:1997

Current

Current

The latest, up-to-date edition.

Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits

Available format(s)

Hardcopy , PDF 1 User , PDF 3 Users , PDF 5 Users , PDF 9 Users

Language(s)

English - French

Published date

22-12-1997

$716.12
Including GST where applicable

Contents
Foreword
Clause
Chapter I: General
1. Scope
2. Normative references
Chapter II: Terminology and Letter Symbols
1. Terminology for combinatorial and sequential
    integrated circuits
2. Examples
3. Terminology for integrated circuit memories
4. Terminology for integrated circuit microprocessors
5. Terminology for charge-transfer devices
6. Letter symbols for combinatorial and sequential
    circuits
7. Letter symbols for the dynamic parameters of
    sequential integrated circuits, including memories
8. Additional terms and definitions for digital integrated
    circuits
9. Classification of programmable logic devices (PLDs)
Chapter III: Essential Ratings and Characteristics
Section One - Digital Integrated Circuits, General
1. Circuit identification and description
2. Functional specifications
3. Ratings (limiting values)
4. Recommended operating conditions (within the specified
    operating temperature range)
5. Static electrical characteristics for bipolar integrated
    circuits
6. Static and quasi-static electrical characteristics for
    MOS integrated circuits
7. Dynamic electrical characteristics
8. Total power or currents provided from the supplies
9. Total current drawn from the power supplies (dynamic
    operation)
10. Command pulse information (where appropriate)
11. Insulation resistance
12. Mechanical ratings, characteristics and other data
13. Supplementary information
14. Handling precautions
Appendix to Section One - Specification of characteristics
Section Two - Integrated Circuit Memories
A. Static and dynamic read/write memories and read/only
    memories
1. Circuit identification and description
2. Functional specifications
3. Ratings (limiting values)
4. Recommended operating conditions (within the specified
    operating temperature range)
5. Static electrical characteristics for bipolar memories
6. Static electrical characteristics for MOS memories
7. Dynamic electrical characteristics
8. Power or current drawn from each supply (static
    operation)
9. Power or current drawn from each supply (dynamic
    operation)
10. Mechanical ratings, characteristics and other data
11. Supplementary information
12. Handling precautions
B. Field-programmable read-only memories
1. Circuit identification and description
2. Functional specifications
3. Ratings (limiting values)
4. Read mode
5. Programming mode
6. Erasing mode (if applicable)
7. Number of programming-erasing cycles
8. Data retention information
9. Power or current drawn from each supply (static
    operation)
10. Power or current drawn from each supply (dynamic
    operation)
11. Mechanical ratings, characteristics and other data
12. Supplementary information
13. Handling precautions
C. Content addressable memories (CAM)
1. Circuit identification and description
2. Functional specifications
3. The provisions of clauses 3 to 6 of Section Two A apply
4. The provisions of clauses 7 and 7.1 of Section Two A
    apply with the exception of 7.1.1 which is replaced by
    the following
5. The provisions of 7.2 and 7.3 of Section Two A apply
6. The provisions of clauses 8 to 12 of Section Two A apply
Section Three - Integrated Circuit Microprocessors
1. Circuit identification and description
2. Functional specifications
3. Ratings (limiting values)
4. Recommended operating conditions (within the specified
    operating temperature range)
5. Electrical characteristics
6. Mechanical ratings, characteristics and other data
7. Supplementary information
8. Handling precautions
Section Four - Programmable Logic Devices (PLDs)
1. Circuit identification and types
2. Application related description
3. Specification of the function
4. Limiting values (absolute maximum rating system)
5. Recommended operating conditions (within the specified
    operating temperature range)
6. Electrical characteristics
7. Programming
8. Design aspects
9. Mechanical and environment rating, characteristics and
    data
10. Additional information
Chapter IV: Measuring Methods
Section One - General
1. Basic requirements
2. Specific requirements
3. Application matrix for the measuring methods
Section Two - Measuring Methods of static Characteristics
1. High-level and low-level output voltages (VOH and VOL)
    37
2. High-level and low-level input currents (/IH and /IL)
    38
3. Short-circuit output current (/OS) 40
4. Power supply current under static conditions 41
5. (Input) threshold voltages and hysteresis voltage 48
6. Input clamping voltage (VIK) 94
7. Off-state output current (/OZ) 95
8. Latch-up characteristics 96
Section Three - Dynamic Measurements
1. Total current drawn from the power supplies under
    dynamic conditions
2. Power supplied through the clock line 2
3. Input and output impedances 6, 11
4. Times characterizing the circuit
5. Switching frequency of a sequential circuit 10
6. Method of verification of the function of a digital
    integrated circuit 97
Chapter V: Acceptance and Reliability
Section One - Electrical Endurance Tests
1. General requirements
2. Specific requirements
Table 7

This publication gives standards for the following categories or sub-categories of devices: -Combinatorial and sequential digital circuits; -Integrated circuit memories; -Integrated circuit microprocessors; -Charge-transfer devices. Should be used together with IEC 60747-1 and 60748-1.

Committee
TC 47/SC 47A
DevelopmentNote
Supersedes IEC 60186B and IEC 60748-2L. (07/2004) Stability Date: 2020. (09/2017)
DocumentType
Standard
Pages
347
PublisherName
International Electrotechnical Committee
Status
Current
Supersedes

Standards Relationship
IS 12970 : Part 2 : 2021 Identical
SAC GB/T 17574 : 1998 Identical
BS IEC 60748-2:1997 Identical
NEN IEC 60748-2 : 1998 Identical
PN IEC 60748-2 : 2002 Identical
DIN IEC 60748-2:1990-11 Identical

08/30180398 DC : 0 BS EN 60747-16-5 - SEMICONDUCTOR DEVICES - PART 16-5: MICROWAVE INTEGRATED CIRCUITS - OSCILLATORS
BS EN 190100:1993 Harmonized system of quality assessment for electronic components: sectional specification: digital monolithic integrated circuits
15/30325282 DC : 0 BS EN 62884-1 - MEASUREMENT TECHNIQUES OF PIEZOELECTRIC, DIELETIRIC AND ELECTROSTATIC OSCILLATORS - PART 1: BASIC METHODS FOR THE MEASUREMENT
BS EN 60747-16-3 : 2002 SEMICONDUCTOR DEVICES - PART 16-3: MICROWAVE INTEGRATED CIRCUITS - FREQUENCY CONVERTERS
I.S. EN 60679-1:2017 PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC OSCILLATORS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
BS IEC 60748-2.20 : 2008 SEMICONDUCTOR DEVICES - INTEGRATED CIRCUITS - PART 2-20: DIGITAL INTEGRATED CIRCUITS - FAMILY SPECIFICATION - LOW VOLTAGE INTEGRATED CIRCUITS
06/30153491 DC : DRAFT JULY 2006 EN 60748-2-20 - SEMICONDUCTOR DEVICES - INTEGRATED CIRCUITS - PART 2-20: DIGITAL INTEGRATED CIRCUITS - FAMILY SPECIFICATION - LOW VOLTAGE INTEGRATED CIRCUITS
BS EN 62884-1:2017 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators Basic methods for the measurement
BS IEC 60748-5:1997 Semiconductor devices. Integrated circuits Semicustom integrated circuits
14/30282293 DC : 0 BS EN 60679-1 - PIEZOELECTRIC AND ASSOCIATED MATERIAL OSCILLATORS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
EN 62884-1:2017 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement
CEI EN 60679-1 : 2009 PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC OSCILLATORS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
BS EN 60747-16-1 : 2002 SEMICONDUCTOR DEVICES - PART 16-1: MICROWAVE INTEGRATED CIRCUITS - AMPLIFIERS
IEC 60748-2-20:2008 Semiconductor devices - Integrated circuits - Part 2-20: Digital integrated circuits - Family specification - Low voltage integrated circuits
I.S. EN 60747-16-1:2002 SEMICONDUCTOR DEVICES - PART 16-1: MICROWAVE INTEGRATED CIRCUITS - AMPLIFIERS
IEC 60748-2-12:2001 Semiconductor devices - Integrated circuits - part2-12: Digital integrated circuits - Blank detail specification for programmable logic devices (PLDs)
BS QC 760200:1997 Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of the capability approval procedures
BS QC 760100:1997 Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of the qualification approval procedures
BS CECC 90300:1988 Harmonized system of quality assessment for electronic components. Sectional specification: interface monolithic integrated circuits
BS IEC 60747-16.2 : 2001 SEMICONDUCTOR DEVICES - PART 16-2: MICROWAVE INTEGRATED CIRCUITS - FREQUENCY PRESCALERS
BS QC 790109:1992 Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits.Family specification for HCMOS digital integrated circuits series 54/74 HC, 54/74 HCT, 54/74 HCU
BS EN 60679-1:2017 Piezoelectric, dielectric and electrostatic oscillators of assessed quality Generic specification
BS IEC 60748-11:2000 Semiconductor devices. Integrated circuits Sectional specification for semiconductor integrated circuits excluding hybrid circuits
BS IEC 60748-2.12 : 2001 SEMICONDUCTOR DEVICES - INTEGRATED CIRCUITS - DIGITAL INTEGRATED CIRCUITS - BLANK DETAIL SPECIFICATION FOR PROGRAMMABLE LOGIC DEVICES (PLDS)
BS QC790100(1991) : 1991 AMD 10586 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - SEMICONDUCTOR DEVICES - SECTIONAL SPECIFICATION FOR SEMICONDUCTOR INTEGRATED CIRCUITS EXCLUDING HYBRID CIRCUITS
I.S. EN 60747-16-3:2002 SEMICONDUCTOR DEVICES - PART 16-3: MICROWAVE INTEGRATED CIRCUITS - FREQUENCY CONVERTERS
I.S. EN 62884-1:2017 MEASUREMENT TECHNIQUES OF PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC OSCILLATORS - PART 1: BASIC METHODS FOR THE MEASUREMENT
IEC 60748-11:1990 Semiconductor devices - Integrated circuits - Part 11: Sectional specification for semiconductor integrated circuits excluding hybrid circuits
IEC 62884-1:2017 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement
IEC 60747-10:1991 Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuits
IEC 60679-1:2017 Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification
IEC 60748-4:1997 Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits
CEI EN 60747-16-1 : 2009 SEMICONDUCTOR DEVICES - PART 16-1: MICROWAVE INTEGRATED CIRCUITS - AMPLIFIERS
EN 60679-1:2017 Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification
IEC 60747-16-2:2001+AMD1:2007 CSV Semiconductor devices - Part 16-2: Microwave integrated circuits - Frequency prescalers
IEC 60747-16-3:2002+AMD1:2009+AMD2:2017 CSV Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters
IEC 61747-1:1998+AMD1:2003 CSV Liquid crystal and solid-state display devices - Part 1: Generic specification
IEC 60747-16-4:2004+AMD1:2009+AMD2:2017 CSV Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches
IEC 60747-16-1:2001+AMD1:2007+AMD2:2017 CSV Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers
DIN EN 190000:1996-05 GENERIC SPECIFICATION - MONOLITHIC INTEGRATED CIRCUITS
EN 60747-16-3:2002/A2:2017 SEMICONDUCTOR DEVICES - PART 16-3: MICROWAVE INTEGRATED CIRCUITS - FREQUENCY CONVERTERS (IEC 60747-16-3:2002/A2:2017)
CEI EN 60747-16-3 : 2009 SEMICONDUCTOR DEVICES - PART 16-3: MICROWAVE INTEGRATED CIRCUITS - FREQUENCY CONVERTERS
BS EN 60747-16-4 : 2004 SEMICONDUCTOR DEVICES - PART 16-4: MICROWAVE INTEGRATED CIRCUITS - SWITCHES
EN 60747-16-1:2002/A2:2017 SEMICONDUCTOR DEVICES - PART 16-1: MICROWAVE INTEGRATED CIRCUITS - AMPLIFIERS (IEC 60747-16-1:2001/A2:2017)
BS CECC90100(1987) : AMD 7845 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS: SECTIONAL SPECIFICATION: DIGITAL MONOLITHIC INTEGRATED CIRCUITS

IEC 60747-1:2006+AMD1:2010 CSV Semiconductor devices - Part 1: General
IEC 60748-1:2002 Semiconductor devices - Integrated circuits - Part 1: General
IEC 60748-3:1986 Semiconductor devices - Integrated circuits - Part 3: Analogue integrated circuits
IEC 60748-4:1997 Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits

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