IEC 60512-6-2:2002
Current
Current
The latest, up-to-date edition.
Connectors for electronic equipment - Tests and measurements - Part 6-2: Dynamic stress tests - Test 6b: Bump
Available format(s)
Hardcopy , PDF 1 User , PDF 3 Users , PDF 5 Users , PDF 9 Users
Language(s)
English - French, Spanish, Castilian
Published date
21-02-2002
Publisher
$37.69
Including GST where applicable
Foreword
1 General
2 Preparation of the specimen
3 Test method
4 Measurements
5 Details to be specified
Defines a standard test method to assess the ability of components (essentially connectors) to withstand specified severities of bump.
| Committee |
TC 48/SC 48B
|
| DevelopmentNote |
Stability Date: 2017. (10/2012)
|
| DocumentType |
Standard
|
| Pages |
9
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Current
|
| Standards | Relationship |
| NF EN 60512-6-2 : 2002 | Identical |
| NEN EN IEC 60512-6-2 : 2002 | Identical |
| I.S. EN 60512-6-2:2002 | Identical |
| PN EN 60512-6-2 : 2006 | Identical |
| BS EN 60512-6-2:2002 | Identical |
| CEI EN 60512-6-2 : 2003 | Identical |
| EN 60512-6-2:2002 | Identical |
| DIN EN 60512-6-2:2003-01 | Identical |
| JIS C 5402-6-2:2005 | Identical |
| UNE-EN 60512-6-2:2002 | Identical |
| BS ISO/IEC 11801-1:2017 | Information technology. Generic cabling for customer premises General requirements |
| ISO/IEC 24702:2006 | Information technology — Generic cabling — Industrial premises |
| EN 50173-1:2011 | Information technology - Generic cabling systems - Part 1: General requirements |
| IEC PAS 61076-3-126:2018 | Connectors for electrical and electronic equipment - Product requirements - Part 3-126: Rectangular connectors - Detail specification for 5 pole power connector for industrial environments with push-pull locking |
| I.S. EN 50173-1:2011 | INFORMATION TECHNOLOGY - GENERIC CABLING SYSTEMS - PART 1: GENERAL REQUIREMENTS |
| 03/100442 DC : DRAFT MAY 2003 | IEC 60352-2 ED.2 - SOLDERLESS CONNECTIONS - PART 2: SOLDERLESS CRIMPED CONNECTIONS - GENERAL REQUIREMENTS, TEST METHODS AND PRACTICAL GUIDANCE |
| BS EN 50173-1:2011 | Information technology. Generic cabling systems General requirements |
| 03/100168 DC : DRAFT JAN 2003 | IEC 61076-3-112 ED.1.0 - CONNECTORS FOR ELECTRONIC EQUIPMENT - PART 3-112: RECTANGULAR CONNECTORS - DETAIL SPECIFICATION - RECTANGULAR CONNECTORS WITH FOUR CONTACTS FOR HIGH PERFORMANCE SERIAL BUS FOR CONSUMER AUDIO/VIDEO EQUIPMENT |
| ISO/IEC 11801-1:2017 | Information technology — Generic cabling for customer premises — Part 1: General requirements |
| CEI EN 50173-1 : 2011 | INFORMATION TECHNOLOGY - GENERIC CABLING SYSTEMS - PART 1: GENERAL REQUIREMENTS |
| 06/30151382 DC : DRAFT JUN 2006 | BS ISO/IEC 24702 - INFORMATION TECHNOLOGY - GENERIC CABLING - INDUSTRIAL PREMISES |
| 16/30325971 DC : 0 | BS ISO/IEC 11801-1 - INFORMATION TECHNOLOGY - GENERIC CABLING FOR CUSTOMER PREMISES - PART 1: GENERAL REQUIREMENTS |
| IEC 60512-7:1993 | Electromechanical components for electronic equipment; basic testing procedures and measuring methods - Part 7: Mechanical operating tests and sealing tests |
| IEC 60512-2-5:2003 | Connectors for electronic equipment - Tests and measurements - Part 2-5: Electrical continuity and contact resistance tests - Test 2e: Contact disturbance |
| IEC 60512-1-1:2002 | Connectors for electronic equipment - Tests and measurements - Part 1-1: General examination - Test 1a: Visual examination |
| IEC 60512-2-1:2002 | Connectors for electronic equipment - Tests and measurements - Part 2-1: Electrical continuity and contact resistance tests - Test 2a: Contact resistance - Millivolt level method |
| EN 60068-2-29:1993 | Environmental testing - Part 2: Tests - Test Eb and guidance: Bump |
| IEC 60068-2-29:1987 | Environmental testing. Part 2: Tests. Test Eb and guidance: Bump |
| EN 60512-1-1:2002 | Connectors for electronic equipment - Tests and measurements - Part 1-1: General examination - Test 1a: Visual examination |
| EN 60512-2-1:2002 | Connectors for electronic equipment - Tests and measurements - Part 2-1: Electrical continuity and contact resistance tests - Test 2a: Contact resistance - Millivolt level method |
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