IEC 60469:2013
Current
The latest, up-to-date edition.
Transitions, pulses and related waveforms - Terms, definitions and algorithms
Hardcopy , PDF 1 User , PDF 3 Users , PDF 5 Users , PDF 9 Users
English - French
23-04-2013
FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms, definitions and symbols
4 Measurement and analysis techniques
5 Analysis algorithms for waveforms
Annex A (informative) - Waveform examples
Bibliography
IEC 60469:2013 provides definitions of terms pertaining to transitions, pulses, and related waveforms and provides definitions and descriptions of techniques and procedures for measuring their parameters. The waveforms considered in this standard are those that make a number of transitions and that remain relatively constant in the time intervals between transitions. Signals and their waveforms for which this standard apply include but are not limited to those used in:
- digital communications, data communications, and computing;
- studies of transient biological, cosmological, and physical events;
- and electrical, chemical, and thermal pulses encountered and used in a variety of industrial, commercial, and consumer applications. This standard does not apply to sinusoidally-varying or other continuously-varying signals and their waveforms. The object of this standard is to facilitate accurate and precise communication concerning parameters of transitions, pulses, and related waveforms and the techniques and procedures for measuring them. IEC 60469:2013 combine the contents of IEC 60469-1 and IEC 60469-2. IEC 60469-1 dealt with terms and definitions for describing waveform parameters and IEC 60469-2 described the waveform measurement process. Other technical revisions include updating of terminology, errors correction, algorithms addition for computing values of pulse parameters, and addition of a newly-developed method for computing state levels. Changes to the definitions include adding new terms and definitions, deleting unused terms and definitions, expanding the list of deprecated terms, and updating and modifying existing definitions.
DevelopmentNote |
Supersedes IEC 60469-1 and IEC 60469-2. Stability date: 2017. (04/2013)
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DocumentType |
Standard
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Pages |
132
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PublisherName |
International Electrotechnical Committee
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Status |
Current
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Supersedes |
Standards | Relationship |
NF EN 60469 : 2013 | Identical |
NEN EN IEC 60469 : 2013 | Identical |
PN EN 60469 : 2014 | Identical |
BS EN 60469:2013 | Identical |
CEI EN 60469 : 2014 | Identical |
EN 60469:2013 | Identical |
DIN EN 60469:2014-02 | Identical |
PNE-FprEN 60469 | Identical |
UNE-EN 60469:2013 | Identical |
IEC 62884-3:2018 | Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 3: Frequency aging test methods |
BS EN 60679-1:2017 | Piezoelectric, dielectric and electrostatic oscillators of assessed quality Generic specification |
BS EN 62884-1:2017 | Measurement techniques of piezoelectric, dielectric and electrostatic oscillators Basic methods for the measurement |
BS EN 60384-1:2016 | Fixed capacitors for use in electronic equipment Generic specification |
I.S. EN 60679-1:2017 | PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC OSCILLATORS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
IEC 60384-1:2016 RLV | Fixed capacitors for use in electronic equipment - Part 1: Generic specification |
NF EN 62754 : 2017 | COMPUTATION OF WAVEFORM PARAMETER UNCERTAINTIES |
EN 62884-2:2017 | Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 2: Phase jitter measurement method |
EN 62884-1:2017 | Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement |
CEI EN 60679-1 : 2009 | PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC OSCILLATORS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
I.S. EN 62884-2:2017 | MEASUREMENT TECHNIQUES OF PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC OSCILLATORS - PART 2: PHASE JITTER MEASUREMENT METHOD |
17/30337173 DC : 0 | BS EN 62884-4 - MEASUREMENT TECHNIQUES OF PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC OSCILLATORS - PART 4: SHORT-TERM FREQUENCY STABILITY TEST METHODS |
IEC 62754:2017 | Computation of waveform parameter uncertainties |
EN 62754:2017 | Computation of waveform Parameter uncertainties |
BS EN 62884-2:2017 | Measurement techniques of piezoelectric, dielectric and electrostatic oscillators Phase jitter measurement method |
I.S. EN 62884-1:2017 | MEASUREMENT TECHNIQUES OF PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC OSCILLATORS - PART 1: BASIC METHODS FOR THE MEASUREMENT |
IEC 60679-1:2017 | Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification |
13/30261629 DC : 0 | BS EN 62792 - ELECTROSHOCK WEAPON MEASUREMENT METHOD |
EN 60679-1:2017 | Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification |
CEI EN 62754 : 1ED 2017 | COMPUTATION OF WAVEFORM PARAMETER UNCERTAINTIES |
EN 60384-1:2016 | Fixed capacitors for use in electronic equipment - Part 1: Generic specification |
IEC 62884-1:2017 | Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement |
IEC 60384-1:2016 | Fixed capacitors for use in electronic equipment - Part 1: Generic specification |
BS EN 62754:2017 | Computation of waveform parameter uncertainties |
EN IEC 62884-3:2018 | Measurement techniques of piezoelectric, dielectric and electrostatic oscillators – Part 3: Frequency aging test methods |
CEI EN 62884-1 : 1ED 2018 | MEASUREMENT TECHNIQUES OF PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC OSCILLATORS - PART 1: BASIC METHODS FOR THE MEASUREMENT |
I.S. EN 62754:2017 | COMPUTATION OF WAVEFORM PARAMETER UNCERTAINTIES |
IEC 62792:2015 | Measurement method for the output of electroshock weapons |
IEEE 270-2006 | IEEE Standard Definitions for Selected Quantities, Units, and Related Terms, with Special Attention to the International System of Units (SI) |
IEEE/ASTM SI_10-2010 | American National Standard for Metric Practice |
ISO/IEC Guide 99:2007 | International vocabulary of metrology Basic and general concepts and associated terms (VIM) |
ISO 10012:2003 | Measurement management systems — Requirements for measurement processes and measuring equipment |
ISO 9000:2015 | Quality management systems — Fundamentals and vocabulary |
ISO/IEC Guide 98-3:2008 | Uncertainty of measurement — Part 3: Guide to the expression of uncertainty in measurement (GUM:1995) |
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