IEC 60444-2:1980
Current
Current
The latest, up-to-date edition.
Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units
Available format(s)
Hardcopy , PDF 1 User , PDF 3 Users , PDF 5 Users , PDF 9 Users
Language(s)
English - French, Russian
Published date
01-01-1980
Publisher
Important note : All end users must be registered with an Account prior to user licenses being assigned.Describes a method of measuring the motional capacitance of quartz crystal units in the frequency range 1 MHz to 125 MHz with a total measurement error of the order of 5%.
| Committee |
TC 49
|
| DevelopmentNote |
Also numbered as BS EN 60444-2 (11/2005) Stability Date: 2017. (09/2017)
|
| DocumentType |
Standard
|
| Pages |
18
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Current
|
| Standards | Relationship |
| PN IEC 444-2 : 1996 | Identical |
| EN 60444-2:1997 | Identical |
| NEN EN IEC 60444-2 : 1997 | Identical |
| NEN 10444-2 : 1982 | Identical |
| DIN EN 60444-2:1997-10 | Identical |
| NF EN 60444-2 : 2001 | Identical |
| DIN IEC 60444-2:1992-11 | Identical |
| SN EN 60444-2 : 1997 | Identical |
| BS 7681-2(1993) : 1993 AMD 9658 | Similar to |
| I.S. EN 60444-2:1999 | Identical |
| UNE-EN 60444-2:1997 | Identical |
| BS CECC68000(1990) : AMD 9184 | HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS: GENERIC SPECIFICATION: QUARTZ CRYSTAL UNITS |
| I.S. EN 168000:1994 | QUARTZ CRYSTAL UNITS (GENERIC SPECIFICATION) |
| I.S. EN 60444-8:2017 | MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS - PART 8: TEST FIXTURE FOR SURFACE MOUNTED QUARTZ CRYSTAL UNITS |
| NF EN 60122-1 : 2003 | QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
| EN 60444-8:2017 | Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units |
| EN 168000 : 1993 AMD 2 1998 | GENERIC SPECIFICATION - QUARTZ CRYSTAL UNITS |
| IEC 60444-8:2016 | Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units |
| BS EN 168000:1996 | Harmonized system of quality assessment for electronic components. Generic specification: quartz crystal units |
| CEI EN 60122-1 : 2004 | QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
| BS EN 60122-1 : 2002 | QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
| IEC 61178-1:1993 | Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 1: Generic specification |
| BS EN 60444-8:2017 | Measurement of quartz crystal unit parameters Test fixture for surface mounted quartz crystal units |
| DIN IEC 60444-4:1992-11 | MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS BY ZERO PHASE TECHNIQUE IN A PI NETWORK; METHOD FOR THE MEASUREMENT OF LOAD RESONANCE FREQUENCY FL, LOAD RESONANCE RESISTANCE RL AND THE CALCULATION OF OTHER DERIVED VALUES OF QUARTZ CRYSTAL UNITS UP TO 30 MHZ |
| I.S. EN 60122-1:2002 AMD 1 2018 | QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
| EN 60122-1:2002/A1:2018 | QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION (IEC 60122-1:2002/A1:2017) |
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