IEC 60134:1961
Current
Current
The latest, up-to-date edition.
Rating systems for electronic tubes and valves and analogous semiconductor devices
Available format(s)
Hardcopy , PDF 1 User , PDF 3 Users , PDF 5 Users , PDF 9 Users
Language(s)
English - French
Published date
01-01-1961
Publisher
Describes rating systems in use for electronic tubes and analogous semiconductor devices. Its object is to bring about a greater understanding of these systems, especially in the division of responsibility between the manufacturer and the circuit designer.
| Committee |
TC 110
|
| DevelopmentNote |
Stability Date: 2024. (11/2012)
|
| DocumentType |
Standard
|
| Pages |
9
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Current
|
| Standards | Relationship |
| NBN C 86 010 : 1984 | Identical |
| NBN C 83 300 : 1985 | Identical |
| NEN 10134 : 1977 | Identical |
| BS 9026:1970 | Rules for the preparation of detail specifications for low noise signal amplifier tubes of assessed quality with integral permanent magnet focusing |
| BS CECC 13000(1981) : 1981 AMD 7573 | HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - GENERIC SPECIFICATION - CAMERA TUBES |
| BS EN 111000:1993 | Harmonized system of quality assessment for electronic components. Generic specification: cathode ray tubes |
| BS EN 114000:1993 | Harmonized system of quality assessment for electronic components: generic specification: photomultiplier tubes |
| BS CECC 12000(1981) : 1981 AMD 9605 | HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - GENERIC SPECIFICATION - IMAGE CONVERTER & IMAGE INTENSIFIER TUBES |
| BS IEC 60748-2.11 : 1999 | SEMICONDUCTOR DEVICES - INTEGRATED CIRCUITS - DIGITAL INTEGRATED CIRCUITS - BLANK DETAIL SPECIFICATION FOR SINGLE SUPPLY INTEGRATED CIRCUIT, ELECTRICALLY ERASABLE, AND PROGRAMMABLE READ-ONLY MEMORY |
| 03/117620 DC : DRAFT NOV 2003 | IEC 60747-1 ED.2 - SEMICONDUCTOR DEVICES - DISCRETE DEVICES AND INTEGRATED CIRCUITS - PART 1: GENERAL |
| BS EN 113000:1993 | Harmonized system of quality assessment for electronic components. Generic specification: camera tubes |
| BS QC 790105:1993 | Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Integrated circuit fusible-link programmable bipolar read-only memories |
| BS EN 165000-1:1996 | Film and hybrid integrated circuits Generic specification. Capability approval procedure |
| IEC 60747-1:2006+AMD1:2010 CSV | Semiconductor devices - Part 1: General |
| BS IEC 60747-1 : 2006 | SEMICONDUCTOR DEVICES - PART 1: GENERAL |
| I.S. EN 136000:1994 | MAGNETRONS (GENERIC SPECIFICATION) |
| I.S. EN 114000:1994 | GENERIC SPECIFICATION: PHOTOMULTIPLIER TUBES |
| DEFSTAN 59-60(PT5)/2(1972) : 1972 | VALVES, ELECTRONIC (ELECTRONIC TUBES) - PART 5: FORWARD TRAVELLING-WAVE AMPLIFIER TUBES |
| BS CECC 11000(1980) : 1980 AMD 7600 | HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - GENERIC SPECIFICATION - CATHODE RAY TUBES |
| EN 135000:1992 | Generic Specification: Travelling wave amplifier tubes |
| EN 114000:1991 | Generic Specification: Photomultiplier tubes |
| BS CECC 90000:1991 | Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits |
| BS CECC 20000:1983 | Harmonized system of quality assessment for electronic components: generic specification: semiconductor optoelectronic and liquid crystal devices |
| BS CECC 90000:1985 | Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits |
| EN 113000:1991 | Generic Specification: Camera tubes |
| BS IEC 60748-4:1997 | Semiconductor devices. Integrated circuits Interface integrated circuits |
| BS 9041:1978 | Rules for the preparation of detail specifications for gas filled microwave switching tubes of assessed quality: tunable and broadband TR tubes and TR limiters. Full assessment level |
| BS CECC14000(1984) : 1984 AMD 7575 | HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS: GENERIC SPECIFICATION: PHOTOMULTIPLIER TUBES |
| BS QC 790111:1993 | Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification: integrated circuit static read/write memories |
| BS PD IEC 62240 : 2001 | USE OF SEMICONDUCTOR DEVICES OUTSIDE MANUFACTURER'S SPECIFIED TEMPERATURE RANGES |
| PD IEC/TR 62240:2005 | Process management for avionics. Use of semiconductor devices outside manufacturers\' specified temperature range |
| I.S. EN 135000:1994 | TRAVELLING WAVE AMPLIFIER TUBES (GENERIC SPECIFICATION) |
| BS CECC14001(1984) : 1984 AMD 7576 | SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS. BLANK DETAIL SPECIFICATION: PHOTOMULTIPLIER TUBES |
| BS 9054:1971 | Rules for the preparation of detail specifications for radar display cathode ray tubes of assessed quality |
| BS CECC 45000:1977 | Specification for harmonized system of quality assessment for electronic components: generic specification: space-charge controlled tubes |
| BS 6493-1.1:1984 | Semiconductor devices. Discrete devices General |
| IEC 60748-2-12:2001 | Semiconductor devices - Integrated circuits - part2-12: Digital integrated circuits - Blank detail specification for programmable logic devices (PLDs) |
| BS CECC 63000:1990 | Harmonized system of quality assessment for electronic components. Generic specification: film and hybrid integrated circuits |
| BS CECC 50000:1987 | Harmonized system of quality assessment for electronic components. Generic specification: discrete semiconductor devices |
| BS 9061:1971 | Rules for the preparation of detail specifications for vidicon tubes of assessed quality electromagnetic focusing and scanning |
| DEFSTAN 59-60(PT3)/2(1977) : 1977 | VALVES, ELECTRONIC (ELECTRONIC TUBES) - PART 3: COUNTER, SELECTOR, AND INDICATOR TUBES |
| BS CECC 13001(1981 : 1981 AMD 7574 | SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BLANK DETAIL SPECIFICATION - CAMERA TUBES |
| BS EN 113001:1997 | Harmonized system of quality assessment for electronic components. Blank detail specification: camera tubes |
| BS IEC 60748-23-1:2002 | Semiconductor devices. Integrated circuits. Hybrid integrated circuits and film structures. Manufacturing line certification Generic specification |
| NF EN 112000 : 2014 | GENERIC SPECIFICATION: IMAGE CONVERTER AND IMAGE INTENSIFIER TUBES |
| BS EN 120000:1996 | Harmonized system of quality assessment for electronic components. General specification: semiconductor optoelectronic and liquid crystal devices |
| BS IEC 60748-2.12 : 2001 | SEMICONDUCTOR DEVICES - INTEGRATED CIRCUITS - DIGITAL INTEGRATED CIRCUITS - BLANK DETAIL SPECIFICATION FOR PROGRAMMABLE LOGIC DEVICES (PLDS) |
| BS 9031:1971 | Rules for the preparation of detail specifications for pulsed fixed-frequency magnetrons of assessed quality |
| I.S. 604:1984 | COLD CATHODE INDICATOR TUBES (GENERIC SPECIFICATION) |
| BS 9018:1973 | Rules for the preparation of detail specifications for pulse modulator hydrogen thyratrons of assessed quality |
| BS 9027:1971 | Rules for the preparation of detail specifications for forward travelling-wave power tubes of assessed quality |
| BS 9064:1983 | Sectional specification for circulators or isolators of assessed quality for capability approval |
| BS 9300:1969 | Specification for semiconductor devices of assessed quality: generic data and methods of test |
| IEC TR 62240-1:2013 | Process management for avionics - Electronic components capability in operation - Part 1: Temperature uprating |
| IEC 60748-23-1:2002 | Semiconductor devices - Integrated circuits - Part 23-1: Hybrid integrated circuits and film structures - Manufacturing line certification - Generic specification |
| IEC TR 62240:2005 | Process management for avionics - Use of semiconductor devices outside manufacturers' specified temperature range |
| I.S. EN 113000:1994 | GENERIC SPECIFICATION: CAMERA TUBES |
| IEC 60748-4:1997 | Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits |
| BS CECC36000(1978) : 1978 AMD 7581 | HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS: GENERIC SPECIFICATION: MAGNETRONS |
| BS 9014:1974 | Specification for pulse modulator hydrogen thyratron tubes of assessed quality: generic data and methods of test |
| BS EN 112000:1997 | Harmonized system of quality assessment for electronic components. Generic specification: image converter and image intensifier tubes |
| DIN IEC 60747-1:1987-03 | SEMICONDUCTOR DEVICES; DISCRETE DEVICES AND INTEGRATED CIRCUITS; GENERAL |
| BS EN 111001:1996 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: cathode ray tubes |
| BS CECC35000(1978) : 1978 AMD 7881 | HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS. GENERIC SPECIFICATION: TRAVELLING WAVE AMPLIFIER TUBES |
| BS 9032:1975 | Rules for the preparation of detail specifications for pulsed magnetrons (excluding frequency-agile magnetrons) of assessed quality. Basic assessment level |
| GEIA 4900 : 2001 | USE OF SEMICONDUCTOR DEVICES OUTSIDE MANUFACTURERS' SPECIFIED TEMPERATURE RANGES |
| BS CECC11001(1980) : 1980 AMD 9098 | SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS. BLANK DETAIL SPECIFICATION: CATHODE RAY TUBES |
| BS 9040:1978 | Specification for gas-filled microwave switching tubes of assessed quality: generic data and methods of test |
| BS EN 112001:1997 | Harmonized system of quality assessment for electronic components. Blank detail specification: image converter and image intensifier tubes |
| BS 9044:1971 | Rules for the preparation of detail specifications for gas-filled microwave switching tubes of assessed quality: passive protection tubes |
| DEFSTAN 59-60(PT5)SECE/1(1972) : 1972 | VALVES, ELECTRONIC (ELECTRONIC TUBES) - PART 5: FORWARD TRAVELLING-WAVE AMPLIFIER TUBES - SECTION E: DETAIL SPECIFICATIONS |
| I.S. EN 165000-1:1998 | FILM AND HYBRID INTEGRATED CIRCUITS - PART 1: GENERIC SPECIFICATION CAPABILITY APPROVAL PROCEDURE |
| I.S. EN 111000:1994 | GENERIC SPECIFICATION: CATHODE RAY TUBES |
| IEC PAS 62240:2001 | Use of semiconductor devices outside manufacturers' specified temperature range |
| EN 136000:1992 | Generic Specification: Magnetrons |
| BS CECC11101(1984) : 1984 AMD 9097 | SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS. BLANK DETAIL SPECIFICATION: DISPLAY STORAGE TUBES |
| BS 9052:1970 | Rules for the preparation of detail specifications for general purpose professional instrument cathode ray tubes of assessed quality |
| BS EN 111101:1996 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Display storage tubes |
| PD IEC/TR 62240-1:2013 | Process management for avionics. Electronic components capability in operation Temperature uprating |
| BS 9043:1977 | Rules for the preparation of detail specifications for gas filled microwave switching tubes of assessed quality: pre-TR tubes. Full assessment level |
| BS EN 114001:1997 | Harmonized system of quality assessment for electronic components. Blank detail specification: photomultiplier tubes |
| DIN EN 190000:1996-05 | GENERIC SPECIFICATION - MONOLITHIC INTEGRATED CIRCUITS |
| BS EN 190000:1996 | Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits |
| 04/30122195 DC : DRAFT SEP 2004 | IEC 60747-1 - SEMICONDUCTOR DEVICES - DISCRETE DEVICES AND INTEGRATED CIRCUITS - PART 1: GENERAL |
| BS 9053:1973 | Rules for the preparation of detail specifications for electrical charge storage display cathode ray tubes of assessed quality |
| BS EN 136002:1996 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: CW magnetrons for RF heating or cooking applications |
| BS CECC12001(1980) : 1980 AMD 7572 | SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS. BLANK DETAIL SPECIFICATION: IMAGE CONVERTER AND IMAGE INTENSIFIER TUBES |
| EN 111000:1991 | Generic Specification: Cathode ray tubes |
| EN 165000-1:1996 | Film and hybrid integrated circuits - Part 1: Generic specification - Capability approval procedure |
| EN 190000:1995 | Generic Specification: Monolithic integrated circuits |
| EN 112000:1992 | Generic Specification: Image converter and image intensifier tubes |
Important note : All end users must be registered with an Account prior to user licenses being assigned.Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.
Are you sure?
Logging out.