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IEC 60122-3:2010

Current

Current

The latest, up-to-date edition.

Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections

Available format(s)

Hardcopy , PDF 1 User , PDF 3 Users , PDF 5 Users , PDF 9 Users

Language(s)

English, English - French

Published date

11-10-2010

$282.68
Including GST where applicable

IEC 60122-3:2010 specifies the outline drawing for quartz crystal units with lead enclosures. The main changes with respect to the previous edition are as follows: 12 of the 48 enclosure types contained in the previous edition have been deleted.

Committee
TC 49
DevelopmentNote
Supersedes IEC 60122-3A, IEC 60122-3B, IEC 60122-3C and IEC 60122-3D. (07/2004) Stability Date: 2017. (09/2017)
DocumentType
Standard
Pages
52
PublisherName
International Electrotechnical Committee
Status
Current
Supersedes

I.S. EN 61837-3:2015 SURFACE MOUNTED PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION - STANDARD OUTLINES AND TERMINAL LEAD CONNECTIONS - PART 3: METAL ENCLOSURES
BS CECC68000(1990) : AMD 9184 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS: GENERIC SPECIFICATION: QUARTZ CRYSTAL UNITS
I.S. EN 60689:2009 MEASUREMENT AND TEST METHODS FOR TUNING FORK QUARTZ CRYSTAL UNITS IN THE RANGE FROM 10 KHZ TO 200 KHZ AND STANDARD VALUES
CEI EN 60689 : 2009 MEASUREMENT AND TEST METHODS FOR TUNING FORK QUARTZ CRYSTAL UNITS IN THE RANGE FROM 10 KHZ TO 200 KHZ AND STANDARD VALUES
EN 61837-2:2011/A1:2014 SURFACE MOUNTED PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION - STANDARD OUTLINES AND TERMINAL LEAD CONNECTIONS - PART 2: CERAMIC ENCLOSURES (IEC 61837-2:2011/A1:2014)
NF EN 60122-1 : 2003 QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
EN 61837-3:2015 Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3: Metal enclosures
EN 60689:2009 Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values
EN 168000 : 1993 AMD 2 1998 GENERIC SPECIFICATION - QUARTZ CRYSTAL UNITS
I.S. EN 168000:1994 QUARTZ CRYSTAL UNITS (GENERIC SPECIFICATION)
IEC 61837-3:2015 Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3: Metal enclosures
09/30200395 DC : 0 BS EN 61837-2 ED. 2 - SURFACE MOUNTED PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION - STANDARD OUTLINES AND TERMINAL LEAD CONNECTIONS - PART 2: CERAMIC ENCLOSURES
13/30278807 DC : 0 BS EN 61837-3 - SURFACE MOUNTED PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTI0N - STANDARD OUTLINES AND TERMINAL LEAD CONNECTIONS - PART 3: METAL ENCLOSURE
BS EN 168000:1996 Harmonized system of quality assessment for electronic components. Generic specification: quartz crystal units
IEC 61178-3-1:1993 Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 3: Sectional specification - Qualification approval - Section 1: Blank detail specification
BS EN 60689:2009 Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values
I.S. EN 61837-2:2011 SURFACE MOUNTED PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION - STANDARD OUTLINES AND TERMINAL LEAD CONNECTIONS - PART 2: CERAMIC ENCLOSURES
BS EN 60122-1 : 2002 QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
IEC 61178-1:1993 Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 1: Generic specification
BS EN 61837-3:2015 Surface mounted piezoelectric devices for frequency control and selection. Standard outlines and terminal lead connections Metal enclosures
IEC 61178-2-1:1993 Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 2: Sectional specification - Capability approval - Section 1: Blank detail specification
IEC 60689:2008 Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values
I.S. EN 60122-1:2002 AMD 1 2018 QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
CEI EN 60122-1 : 2004 QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
BS EN 61837-2 : 2011 SURFACE MOUNTED PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION - STANDARD OUTLINES AND TERMINAL LEAD CONNECTIONS - PART 2: CERAMIC ENCLOSURES
EN 60122-1:2002/A1:2018 QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION (IEC 60122-1:2002/A1:2017)

ISO 1101:2017 Geometrical product specifications (GPS) — Geometrical tolerancing — Tolerances of form, orientation, location and run-out
IEC 61178-3:1993 Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 3: Sectional specification - Qualification approval
IEC 61178-3-1:1993 Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 3: Sectional specification - Qualification approval - Section 1: Blank detail specification
IEC 60122-2:1983 Quartz crystal units for frequency control and selection - Part 2: Guide to the use of quartz crystal units for frequency control and selection
IEC 60122-1:2002 Quartz crystal units of assessed quality - Part 1: Generic specification
IEC 61178-2:1993 Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 2: Sectional specification - Capability approval
IEC 61178-2-1:1993 Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 2: Sectional specification - Capability approval - Section 1: Blank detail specification

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