IEC 60122-1:2002
Superseded
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
Quartz crystal units of assessed quality - Part 1: Generic specification
Amended by
Available format(s)
Hardcopy , PDF 1 User , PDF 3 Users , PDF 5 Users , PDF 9 Users
Superseded date
09-12-2019
Superseded by
Language(s)
English - French
Published date
09-08-2002
Publisher
Important note : All end users must be registered with an Account prior to user licenses being assigned.Specifies the methods of test and general requirements for quartz crystal units of assessed quality using either capability approval or qualification approval procedures.
| Committee |
TC 49
|
| DocumentType |
Standard
|
| Pages |
105
|
| ProductNote |
NEW CHILD AMD 1 2017 IS NOW ADDED.
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
| Standards | Relationship |
| UNE-EN 60122-1:2002 | Identical |
| I.S. EN 60122-1:2002 AMD 1 2018 | Identical |
| NEN EN IEC 60122-1 : 2003 | Identical |
| CEI EN 60122-1 : 2004 | Identical |
| GOST R IEC 60122-1 : 2009 | Identical |
| NF EN 60122-1 : 2003 | Identical |
| JIS C 6701:2007 | Identical |
| OVE/ONORM EN 60122-1 : 2003 | Identical |
| DIN EN 60122-1:2003-06 | Identical |
| BS EN 60122-1 : 2002 | Identical |
| PN EN 60122-1 : 2006 | Identical |
| IEC 63041-2:2017 | Piezoelectric sensors - Part 2: Chemical and biochemical sensors |
| BS EN 168200:1996 | Harmonized system of quality assessment for electronic components. Sectional specification: quartz crystal units (qualification approval) |
| BS EN 60862-1:2015 | Surface acoustic wave (SAW) filters of assessed quality Generic specification |
| 12/30258507 DC : 0 | BS EN 62575-1 - RADIO FREQUENCY (RF) BUK ACOUSTIC WAVE (BAW) FILTERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
| BS EN 62575-1:2016 | Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality Generic specification |
| 13/30280840 DC : 0 | BS EN 60758 - SYNTHETIC QUART CRYSTAL - SPECIFICATIONS AND GUIDELINES FOR THE USE |
| 03/108947 DC : DRAFT MAY 2003 | IEC 60758 ED.3 - SYNTHETIC QUARTZ CRYSTAL - SPECIFICATIONS AND GUIDE TO THE USE |
| 15/30325282 DC : 0 | BS EN 62884-1 - MEASUREMENT TECHNIQUES OF PIEZOELECTRIC, DIELETIRIC AND ELECTROSTATIC OSCILLATORS - PART 1: BASIC METHODS FOR THE MEASUREMENT |
| 10/30240248 DC : 0 | BS EN 60862-1 - SURFACE ACOUSTIC WAVE (SAW) FILTERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
| 17/30358131 DC : 0 | BS IEC 60122-4 ED.1.0 - QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 4: CRYSTAL UNITS WITH THERMISTORS |
| BS EN 62884-1:2017 | Measurement techniques of piezoelectric, dielectric and electrostatic oscillators Basic methods for the measurement |
| NF EN 60444-11 : 2011 | MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS - PART 11: STANDARD METHOD FOR THE DETERMINATION OF THE LOAD RESONANCE FREQUENCY FL AND THE EFFECTIVE LOAD CAPACITANCE CLEFF USING AUTOMATIC NETWORK ANALYZER TECHNIQUES AND ERROR CORRECTION |
| I.S. EN 168000:1994 | QUARTZ CRYSTAL UNITS (GENERIC SPECIFICATION) |
| I.S. EN 60689:2009 | MEASUREMENT AND TEST METHODS FOR TUNING FORK QUARTZ CRYSTAL UNITS IN THE RANGE FROM 10 KHZ TO 200 KHZ AND STANDARD VALUES |
| CEI EN 60689 : 2009 | MEASUREMENT AND TEST METHODS FOR TUNING FORK QUARTZ CRYSTAL UNITS IN THE RANGE FROM 10 KHZ TO 200 KHZ AND STANDARD VALUES |
| I.S. EN 60444-8:2017 | MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS - PART 8: TEST FIXTURE FOR SURFACE MOUNTED QUARTZ CRYSTAL UNITS |
| I.S. EN IEC 63041-1:2018 | PIEZOELECTRIC SENSORS - PART 1: GENERIC SPECIFICATIONS |
| EN IEC 63041-1:2018 | Piezoelectric sensors - Part 1: Generic specifications |
| I.S. EN 62575-1:2016 | RADIO FREQUENCY (RF) BULK ACOUSTIC WAVE (BAW) FILTERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
| IEC 60122-3:2010 | Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections |
| EN 61019-1:2005 | Surface acoustic wave (SAW) resonators - Part 1: Generic specification |
| EN 60444-8:2017 | Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units |
| EN 60689:2009 | Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values |
| EN 60758:2016 | Synthetic quartz crystal - Specifications and guidelines for use |
| EN 62604-1:2015 | Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 1: Generic specification |
| EN 60027-2:2007 | Letter symbols to be used in electrical technology - Part 2: Telecommunications and electronics |
| OVE/ONORM EN 60027-2 : 2007 | LETTER SYMBOLS TO BE USED IN ELECTRICAL TECHNOLOGY - PART 2: TELECOMMUNICATIONS AND ELECTRONICS |
| MIL-PRF-3098 Revision L:2017 | CRYSTAL UNITS, QUARTZ, GENERAL SPECIFICATION FOR |
| BS EN 60027-2:2007 | Letter symbols to be used in electrical technology Telecommunications and electronics |
| 14/30282293 DC : 0 | BS EN 60679-1 - PIEZOELECTRIC AND ASSOCIATED MATERIAL OSCILLATORS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
| I.S. EN 62604-1:2015 | SURFACE ACOUSTIC WAVE (SAW) AND BULK ACOUSTIC WAVE (BAW) DUPLEXERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
| I.S. EN 61019-1:2005 | SURFACE ACOUSTIC WAVE (SAW) RESONATORS - PART 1: GENERIC SPECIFICATION |
| EN 62884-1:2017 | Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement |
| I.S. EN 60027-2:2007 | LETTER SYMBOLS TO BE USED IN ELECTRICAL TECHNOLOGY - PART 2: TELECOMMUNICATIONS AND ELECTRONICS |
| I.S. EN 60122-3:2010 | QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 3: STANDARD OUTLINES AND LEAD CONNECTIONS |
| IEC 60444-8:2016 | Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units |
| IEC TS 61994-1:2007 | Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 1: Piezoelectric and dielectric resonators |
| BS EN 60122-3:2010 | Quartz crystal units of assessed quality Standard outlines and lead connections |
| BS EN 61019-1:2005 | Surface acoustic wave (SAW) resonators Generic specification |
| BS EN 60679-1:2017 | Piezoelectric, dielectric and electrostatic oscillators of assessed quality Generic specification |
| 07/30161553 DC : 0 | BS EN 60758 - SYNTHETIC QUARTZ CRYSTAL - SPECIFICATIONS AND GUIDE TO THE USE |
| BIS IS/IEC 60862-1 : 2003 | SURFACE ACOUSTIC WAVE (SAW) FILTERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
| BS EN 168000:1996 | Harmonized system of quality assessment for electronic components. Generic specification: quartz crystal units |
| I.S. EN 60679-1:2017 | PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC OSCILLATORS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
| I.S. EN IEC 63041-2:2018 | PIEZOELECTRIC SENSORS - PART 2: CHEMICAL AND BIOCHEMICAL SENSORS |
| IEC 63041-1:2017 | Piezoelectric sensors - Part 1: Generic specifications |
| I.S. EN 62884-1:2017 | MEASUREMENT TECHNIQUES OF PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC OSCILLATORS - PART 1: BASIC METHODS FOR THE MEASUREMENT |
| IEC 60679-1:2017 | Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification |
| IEC 60027-2:2005 | Letter symbols to be used in electrical technology - Part 2: Telecommunications and electronics |
| IEC 62575-1:2015 | Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 1: Generic specification |
| EN 60444-11:2010 | Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction |
| CEI EN 60758 : 2010 | SYNTHETIC QUARTZ CRYSTAL - SPECIFICATIONS AND GUIDELINES FOR USE |
| BS EN 62604-1:2015 | Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality Generic specification |
| BS EN 60689:2009 | Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values |
| 08/30180527 DC : DRAFT JULY 2008 | BS EN 60444-11 - MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS - PART 11: STANDARD METHOD FOR THE DETERMINATION OF THE LOAD RESONANCE FREQUENCY FL AND THE EFFECTIVE LOAD CAPACITANCE CLEFF USING AUTOMATIC NETWORK ANALYZER TECHNIQUES AND ERROR CORRECTION |
| 12/30252220 DC : DRAFT MAR 2012 | BS EN 62604-1 - SURFACE ACOUSTIC WAVE (SAW) AND BULK ACOUSTIC WAVE (BAW) DUPLEXERS - PART 1: GENERIC SPECIFICATION |
| BS EN 60758:2016 | Synthetic quartz crystal. Specifications and guidelines for use |
| BS EN 60444-11:2010 | Measurement of quartz crystal unit parameters Standard method for the determination of the load resonance frequency ƒL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction |
| BS EN 60444-8:2017 | Measurement of quartz crystal unit parameters Test fixture for surface mounted quartz crystal units |
| CEI EN 60444-11 : 2011 | MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS - PART 11: STANDARD METHOD FOR THE DETERMINATION OF THE LOAD RESONANCE FREQUENCY F[L] AND THE EFFECTIVE LOAD CAPACITANCE C[LEFF] USING AUTOMATIC NETWORK ANALYZER TECHNIQUES AND ERROR CORRECTION |
| 13/30283831 DC : 0 | BS EN 60444-8:2003+A1 - MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS - PART 8: TEST FIXTURE FOR SURFACE MOUNTED QUARTZ CRYSTAL UNITS |
| NF EN 60027-2 : 2007 | LETTER SYMBOLS TO BE USED IN ELECTRICAL TECHNOLOGY - PART 2: TELECOMMUNICATIONS AND ELECTRONICS |
| EN 60679-1:2017 | Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification |
| ISO 17859:2015 | Fine ceramics (advanced ceramics, advanced technical ceramics) Measurement method of piezoelectric strain at high electric field |
| EN IEC 63041-2:2018 | Piezoelectric Sensors - Part 2: Chemical and Biochemical Sensors |
| IEC 62604-1:2015 | Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 1: Generic specification |
| IEC 60689:2008 | Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values |
| IEC 60862-1:2015 | Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification |
| IEC 61019-1:2004 | Surface acoustic wave (SAW) resonators - Part 1: Generic specification |
| EN 60862-1:2015 | Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification |
| 09/30200785 DC : 0 | BS EN 60122-3 - QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 3: STANDARD OUTLINES AND LEAD CONNECTIONS |
| I.S. EN 60758:2016 | SYNTHETIC QUARTZ CRYSTAL - SPECIFICATIONS AND GUIDELINES FOR USE |
| 11/30243576 DC : DRAFT FEB 2011 | BS EN 62643-1 - ELECTROSTATIC MICRO ELECTRO MECHANICAL SYSTEMS (MEMS) OSCILLATORS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
| BS ISO 17859:2015 | Fine ceramics (advanced ceramics, advanced technical ceramics). Measurement method of piezoelectric strain at high electric field |
| DD IEC/TS 61994-1:2007 | Piezoelectric and dielectric devices for frequency control and selection. Glossary Piezoelectric and dielectric resonators |
| I.S. EN 60862-1:2015 | SURFACE ACOUSTIC WAVE (SAW) FILTERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
| IEC 62884-1:2017 | Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement |
| IEC 60758:2016 | Synthetic quartz crystal - Specifications and guidelines for use |
| I.S. EN 60444-11:2010 | MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS - PART 11: STANDARD METHOD FOR THE DETERMINATION OF THE LOAD RESONANCE FREQUENCY F[L] AND THE EFFECTIVE LOAD CAPACITANCE C[LEFF] USING AUTOMATIC NETWORK ANALYZER TECHNIQUES AND ERROR CORRECTION |
| IEC 60444-11:2010 | Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency f<sub>L</sub> and the effective load capacitance C<sub>Leff</sub> using automatic network analyzer techniques and error correction |
| EN 60122-3:2010 | Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections |
| EN 62575-1:2016 | Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 1: Generic specification |
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