I.S. EN IEC 61967-4:2021
Current
The latest, up-to-date edition.
Integrated circuits - Measurement of electromagnetic emissions - Part 4: Measurement of conducted emissions - 1 Ω/150 Ω direct coupling method (IEC 61967-4:2021)
Hardcopy , PDF
English
17-05-2021
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FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 General
5 Test conditions
6 Test equipment
7 Test setup
8 Test procedure
9 Test report
Annex A (informative) Probe verification procedure
Annex B (informative) Classification of conducted emission levels
Annex C (informative) Example of reference levels for automotive applications
Annex D (informative) EMC requirements and how to use EMC IC measurement techniques
Annex E (informative) Example of a test setup consisting of an EMC main test board and an EME IC test board
Annex F (informative) 150 Ω direct coupling networks for common mode emission measurements of differential mode data transfer ICs and similar circuits
Annex G (informative) Measurement of conducted emissions in extended frequency range
Bibliography
This part of IEC 61967 specifies a method to measure the conducted electromagnetic emission (EME) of integrated circuits by direct radio frequency (RF) current measurement with a 1 Ω resistive probe and RF voltage measurement using a 150 Ω coupling network.
| Committee |
TC 47
|
| DocumentType |
Standard
|
| ISBN |
978-2-8322-9568-7
|
| Pages |
102
|
| ProductNote |
The date of any NSAIprevious adoption may not matchthe date of its original CEN/CENELEC document.
|
| PublisherName |
National Standards Authority of Ireland
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| EN IEC 61967-4:2021 | Identical |
| IEC 61967-4:2021 | Identical |
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