I.S. EN 61751:1999
Current
The latest, up-to-date edition.
LASER MODULES USED FOR TELECOMMUNICATION - RELIABILITY ASSESSMENT
Hardcopy , PDF
English
01-01-1999
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FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Laser reliability and quality assurance procedure
4.1 Demonstration of product quality
4.2 Testing responsibilities
4.3 Quality Improvement Programmes (QIPs)
5 Tests
5.1 Structural similarity
5.2 Burn-in and screening (when applicable in the DS)
6 Activities
6.1 Analysis of reliability results
6.2 Technical visits to LMMs
6.3 Design/process changes
6.4 Deliveries
6.5 Supplier documentation
Annex A (normative) Laser diode and laser module failure mechanisms
Annex B (informative) Guide
Annex ZA (normative) Normative references to international
publications with their corresponding European
publications
Covers: - standard method of assessing the reliability of laser modules in order to minimize risks and to promote product development and reliability; - means by which the distribution of failures with time can be determined.
| DevelopmentNote |
For CENELEC adoptions of IEC publications, please check www.iec.ch to be sure that you have any corrigenda that may apply. (01/2017)
|
| DocumentType |
Standard
|
| Pages |
88
|
| PublisherName |
National Standards Authority of Ireland
|
| Status |
Current
|
| Standards | Relationship |
| SN EN 61751 : 1998 | Identical |
| IEC 61751:1998 | Identical |
| NBN EN 61751 : 1998 | Identical |
| BS EN 61751:1998 | Identical |
| DIN EN 61751:1998-11 | Identical |
| NF EN 61751 : 1998 | Identical |
| EN 61751:1998 | Identical |
| MIL-STD-883 Revision K:2016 | TEST METHOD STANDARD - MICROCIRCUITS |
| EN 60068-2-1:2007 | Environmental testing - Part 2-1: Tests - Test A: Cold |
| HD 323.2.14 : 200S2 | BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST N: OF TEMPERATURE |
| IEC 60747-12-2:1995 | Semiconductor devices - Part 12: Optoelectronic devices - Section 2: Blank detail specification for laser diode modules with pigtail for fibre optic systems and sub-systems |
| IEC 60747-1:2006+AMD1:2010 CSV | Semiconductor devices - Part 1: General |
| IEC 60749:1996+AMD1:2000+AMD2:2001 CSV | Semiconductor devices - Mechanical and climatic test methods |
| ISO 9000:2015 | Quality management systems — Fundamentals and vocabulary |
| IEC 60068-2-1:2007 | Environmental testing - Part 2-1: Tests - Test A: Cold |
| IEC 60068-2-14:2009 | Environmental testing - Part 2-14: Tests - Test N: Change of temperature |
| EN ISO 9000:2015 | Quality management systems - Fundamentals and vocabulary (ISO 9000:2015) |
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