I.S. EN 61587-5:2014
Current
The latest, up-to-date edition.
MECHANICAL STRUCTURES FOR ELECTRONIC EQUIPMENT - TESTS FOR IEC 60917 AND IEC 60297 - PART 5: SEISMIC TESTS FOR CHASSIS, SUBRACKS AND PLUG-IN UNITS
Hardcopy , PDF
English
01-01-2014
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FOREWORD
INTRODUCTION
1 Scope and object
2 Normative references
3 Terms and definitions
4 Equipment test categories
5 Test waveform and acceleration condition
6 Test setup and parts to be monitored
Annex A (informative) - Example of test setup reporting
Bibliography
Annex ZA (normative) - Normative references to international
publications with their corresponding European
Defines seismic test requirements for chassis, subracks, and plug-in units as defined in the IEC 60297 and IEC 60917 series.
| DevelopmentNote |
For CENELEC adoptions of IEC publications, please check www.iec.ch to be sure that you have any corrigenda that may apply. (01/2017)
|
| DocumentType |
Standard
|
| Pages |
62
|
| PublisherName |
National Standards Authority of Ireland
|
| Status |
Current
|
| Standards | Relationship |
| EN 61587-5:2014 | Identical |
| IEC 60297-3-101:2004 | Mechanical structures for electronic equipment - Dimensions of mechanical structures of the 482,6 mm (19 in) series - Part 3-101: Subracks and associated plug-in units |
| ATIS 0600329 : 2014 | NETWORK EQUIPMENT - EARTHQUAKE RESISTANCE |
| EN 60068-2-57:2013 | Environmental testing - Part 2-57: Tests - Test Ff: Vibration - Time-history and sine-beat method |
| HD 478.2.6 : 200S1 | CLASSIFICATION OF ENVIRONMENTAL CONDITIONS - ENVIRONMENTAL CONDITIONS APPEARING IN NATURE - EARTHQUAKE VIBRATION AND SHOCK |
| IEC 61587-2:2011 | Mechanical structures for electronic equipment - Tests for IEC 60917 and 60297 - Part 2: Seismic tests for cabinets and racks |
| IEC 61587-3:2013 | Mechanical structures for electronic equipment - Tests for IEC 60917 and IEC 60297 - Part 3: Electromagnetic shielding performance tests for cabinets and subracks |
| IEC 61587-1:2016 | Mechanical structures for electronic equipment - Tests for IEC 60917 and IEC 60297 series - Part 1: Environmental requirements, test set-up and safety aspects for cabinets, racks, subracks and chassis under indoor condition use and transportation |
| IEC 60068-2-57:2013 | Environmental testing - Part 2-57: Tests - Test Ff: Vibration - Time-history and sine-beat method |
| EN 60297-3-101:2004 | Mechanical structures for electronic equipment - Dimensions of mechanical structures of the 482,6 mm (19 in) series - Part 3-101: Subracks and associated plug-in units |
| EN 61587-1:2017 | Mechanical structures for electronic equipment - Tests for IEC 60917 and IEC 60297 series - Part 1: Environmental requirements, test set-up and safety aspects for cabinets, racks, subracks and chassis under indoor condition use and transportation |
| IEC 60068-3-3:1991 | Environmental testing - Part 3-3: Guidance - Seismic test methods for equipments |
| EN 60068-3-3:1993 | Environmental testing - Part 3: Guidance - Seismic test methods for equipments |
| EN 61587-3:2013 | Mechanical structures for electronic equipment - Tests for IEC 60917 and IEC 60297 - Part 3: Electromagnetic shielding performance tests for cabinets and subracks |
| IEC 60068-2-47:2005 | Environmental testing - Part 2-47: Test - Mounting of specimens for vibration, impact and similar dynamic tests |
| IEC 60721-2-6:1990 | Classification of environmental conditions. Part 2: Environmental conditions appearing in nature. Earthquake vibration and shock |
| IEC 60512-2-1:2002 | Connectors for electronic equipment - Tests and measurements - Part 2-1: Electrical continuity and contact resistance tests - Test 2a: Contact resistance - Millivolt level method |
| EN 60068-2-6:2008 | Environmental testing - Part 2-6: Tests - Test Fc: Vibration (sinusoidal) |
| EN 60068-2-47:2005 | Environmental testing - Part 2-47: Tests - Mounting of specimens for vibration, impact and similar dynamic tests |
| EN 60512-2-1:2002 | Connectors for electronic equipment - Tests and measurements - Part 2-1: Electrical continuity and contact resistance tests - Test 2a: Contact resistance - Millivolt level method |
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