I.S. EN 160200-1:1998
Withdrawn
A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.
MICROWAVE MODULAR ELECTRONIC UNITS OF ASSESSED QUALITY - PART 1: CAPABILITY APPROVAL PROCEDURE (SECTIONAL SPECIFICATION)
Hardcopy , PDF
02-06-2021
English
01-01-1998
For Harmonized Standards, check the EU site to confirm that the Standard is cited in the Official Journal.
Only cited Standards give presumption of conformance to New Approach Directives/Regulations.
Section 1: General matters
1.1 Scope
1.2 Related documents
1.3 Units, symbols and terminology
1.3.1 Microwave modular electronic unit (MMEU)
1.3.2 Components
1.4 Standard and preferred values
1.4.1 Preferred climatic categories
1.4.2 Preferred interfaces and fixings
1.5 Marking
Section 2: Quality Assessment procedures
2.1 General
2.1.1 Eligibility for capability approval
2.1.2 Primary stage of manufacture
2.1.3 Sub-contracting
2.1.4 Incorporated components
2.1.5 Structurally similar units
2.1.6 Validity of release
2.1.7 Rework
2.1.8 Repair
2.1.9 Resubmission of rejected lots (for lot-by-lot
inspection)
2.2 Procedure for capability approval
2.2.1 Application for capability approval
2.2.2 Granting of a capability approval
2.2.3 Description of capability (capability manual)
2.2.4 Capability qualifying components (CQCs)
2.2.5 Demonstration and verification of capability
2.2.6 Procedures to be followed in the event of
CQC failure
2.2.7 Abstract of description of capability
2.3 Procedures following the granting of capability approval
2.3.1 Maintenance of capability approval
2.3.2 Procedures to be followed in the event of CQC
failure
2.3.3 Modifications likely to affect the validity of
the capability approval
2.3.4 Extension of capability approval
2.4 Release for delivery
2.4.1 Quality conformance inspection requirements
2.4.2 Customer detail specification
2.4.3 Detail specification for standard catalogue
items to be included in the QPL
Section 3: Test and measurement procedures
3.1 General
3.2 Standard conditions for testing
3.2.1 Standard atmospheric conditions
3.2.2 Electrical measurements
3.3 Alternative test methods
3.4 Measurement uncertainty
3.5 Visual inspection, dimensions/gauging and mass test
methods
3.6 Environmental, mechanical and endurance test methods
3.7 Electrical and performance test methods
Annexes
A.1 Generic process flow chart - Process
A.2 Process flow chart - Waveguide technology
A.3 Process flow chart - Ferrite technology
A.4 Process flow chart - Substrate line and component
technology
A.5 Process flow chart - Diode/transistor and complex
circuit technology
B Capability approval test report
C Abstract of capability
D Requirements for the form and content of a capability
manual
E.1 Example of CQC selection matrix - single technology
E.2 Example of CQC selection matrix - multiple technologies
Covers a system for capability approval of manufacturers of Microwave Modular Electronic Units not included in other CECC specifications. Specifies standard terms, inspection and test methods for capability approval of MMEUs, which can be supplied to either a Customer's Detail Specification (CDS) or as standard catalogue items.
DocumentType |
Standard
|
Pages |
50
|
PublisherName |
National Standards Authority of Ireland
|
Status |
Withdrawn
|
Standards | Relationship |
SN EN 160200-1 : 1993 | Identical |
NEN EN 160200-1 : 1998 | Identical |
BS EN 160200-1:1998 | Identical |
DIN EN 160200-1:1998-05 | Identical |
EN 160200-1 : 1997 | Identical |
CECC 00114-3 : 94 AMD 2 | CAPABILITY APPROVAL OF AN ELECTRONIC COMPONENT MANUFACTURING ACTIVITY |
CECC 22000 : 1993 | GENERIC SPECIFICATION: RADIO FREQUENCY COAXIAL CONNECTORS |
IEC 60410:1973 | Sampling plans and procedures for inspection by attributes |
EN 100015-1 : 1992 | HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS. BASIC SPECIFICATION: PROTECTION OF ELECTROSTATIC SENSITIVE DEVICES - GENERAL REQUIREMENTS |
EN 160200-2 : 1997 | MICROWAVE MODULAR ELECTRONIC UNITS OF ASSESSED QUALITY - PART 2: INDEX OF TEST METHODS (SECTIONAL SPECIFICATION) |
CECC 00016 : 1990 | BASIC SPECIFICATION - BASIC REQUIREMENTS FOR THE USE OF STATISTICAL PROCESS CONTROL (SPC) IN THE CECC SYSTEM |
IEC 60050-726:1982 | International Electrotechnical Vocabulary (IEV) - Part 726: Transmission lines and waveguides |
CECC 00200 : 2002 | REGISTER OF FIRMS, PRODUCTS AND SERVICES APPROVED UNDER CECC CERTIFICATION SYSTEM FOR ELECTRONIC COMPONENTS |
CECC 00009 : 1980 | BASIC SPECIFICATION: BASIC TESTING PROCEDURES AND MEASURING METHODS FOR ELECTROMECHANICAL COMPONENTS |
CECC 63000 : 84 AMD 5 | GENERIC SPECIFICATION: FILM & HYBRID INTEGRATED CIRCUITS |
CECC 00007 : 1978 | BASIC SPECIFICATION: SAMPLING PLANS AND PROCEDURES FOR INSPECTION BY ATTRIBUTES |
CECC 00400 : 86 ERRATUM 92 | HANDBOOK FOR THE PRODUCTION OF CECC DOCUMENTS |
CECC 00017 : 1994 | HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BASIC SPECIFICATION: MICROWAVE COMMON MODULES FOR USE UP TO 20 GHZ - INTERFACES, FIXINGS, CONNECTION PROTOCOL AND MODULE CODING |
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