I.S. EN 153000:1998
Current
The latest, up-to-date edition.
DISCRETE PRESSURE CONTACT POWER SEMICONDUCTOR DEVICES (QUALIFICATION APPROVAL) (GENERIC SPECIFICATION)
Hardcopy , PDF
English
01-01-1998
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1 General
2 Quality assessment procedures
3 Test and measurement procedures (general guidance)
Annex A General inspection requirements for rectifier
diodes and thyristors
Annex B Additional electrical test methods
Annex C Screening
Annex D Dimensions
Annex E Direction of applied forces for mechanical tests
Figures
Applicable to discrete pressure contact power semiconductor devices known as rectifier diodes, transistors, thyristors and their derivatives. Also describes encapsulated assemblies. Not applicable to stacks or assemblies made from these encapsulated components.
| DocumentType |
Standard
|
| Pages |
44
|
| PublisherName |
National Standards Authority of Ireland
|
| Status |
Current
|
| Standards | Relationship |
| SN EN 153000 : 1998 | Identical |
| EN 153000:1998 | Identical |
| DIN EN 153000:1999-01 | Identical |
| NEN EN 153000 : 1998 | Identical |
| BS EN 153000:1998 | Identical |
| IEC 60068-1:2013 | Environmental testing - Part 1: General and guidance |
| IEC 60410:1973 | Sampling plans and procedures for inspection by attributes |
| ISO 8601:2004 | Data elements and interchange formats Information interchange Representation of dates and times |
| EN 100114-1 : 1996 | RULE OF PROCEDURE - QUALITY ASSESSMENT PROCEDURES - PART 1: CECC REQUIREMENTS FOR THE APPROVAL OF AN ORGANIZATION |
| IEC 60068-2-17:1994 | Basic environmental testing procedures - Part 2-17: Tests - Test Q: Sealing |
| IEC 60068-2-2:2007 | Environmental testing - Part 2-2: Tests - Test B: Dry heat |
| CECC 00111 : 80 AMD 3 | CECC RULES OF PROCEDURE: RP 11: SPECIFICATIONS AND THEIR HARMONIZATION - COMPONENTS FOR GENERAL AND PROFESSIONAL USAGE - COMPONENTS OF ENHANCED ASSESSMENT OF QUALITY |
| ISO 2015:1976 | Numbering of weeks |
| ISO 497:1973 | Guide to the choice of series of preferred numbers and of series containing more rounded values of preferred numbers |
| IEC 60148:1969 | Letter symbols for semiconductor devices and integrated microcircuits |
| IEC 60747-6:2016 | Semiconductor devices - Part 6: Discrete devices - Thyristors |
| IEC 60068-2-14:2009 | Environmental testing - Part 2-14: Tests - Test N: Change of temperature |
| CECC 00007 : 1978 | BASIC SPECIFICATION: SAMPLING PLANS AND PROCEDURES FOR INSPECTION BY ATTRIBUTES |
| IEC 60747-2:2016 | Semiconductor devices - Part 2: Discrete devices - Rectifier diodes |
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