I.S. EN 132100:1998
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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SECTIONAL SPECIFICATION: FIXED MULTILAYER CERAMIC SURFACE MOUNTING CAPACITORS - ASSESSMENT LEVELS EZ AND DZ
Hardcopy , PDF
13-12-2004
English
01-01-1998
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Only cited Standards give presumption of conformance to New Approach Directives/Regulations.
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FOREWORD
1 GENERAL
1.1 Scope
1.2 Related documents
1.3 Information to be given in a detail specification
1.4 Terminology
1.5 Marking
2 PREFERRED RATINGS AND CHARACTERISTICS
2.1 Preferred climatic categories
2.2 Preferred values of ratings
3 QUALITY ASSESSMENT PROCEDURES
3.1 Primary stage of manufacture
3.2 Structurally similar components
3.3 Certified test records of released lots
3.4 Qualification approval
3.5 Quality conformance inspection
4 TEST AND MEASUREMENT PROCEDURES
4.1 Special preconditioning
4.2 Preliminary drying
4.3 Measuring conditions
4.4 Mounting
4.5 Visual examination and check of dimensions
4.6 Electrical tests
4.7 Variation of capacitance with temperature
4.8 Shear test
4.9 Substrate bending test
4.10 Resistance to soldering heat
4.11 Solderability
4.12 Rapid change of temperature
4.13 Climatic sequence
4.14 Damp heat, steady state
4.15 Endurance
4.16 Robustness of terminations
4.17 Component solvent resistance
4.18 Solvent resistance of the marking
4.19 Accelerated damp heat, steady state
ANNEX A1 LIST OF TESTS AND SAMPLING PLAN FOR QUALIFICATION
APPROVAL ASSESSMENT LEVEL EZ
ANNEX A2 LIST OF TESTS FOR CONFORMANCE (LOT-BY-LOT)
INSPECTION, ASSESSMENT LEVEL EZ
ANNEX A3 LIST OF TESTS FOR CONFORMANCE (PERIODIC)
INSPECTION, ASSESSMENT LEVEL EZ
ANNEX A4 TEST SCHEDULE FOR QUALIFICATION APPROVAL,
ASSESSMENT LEVEL EZ
ANNEX B CAPACITANCE AGEING OF FIXED CAPACITORS OF
CERAMIC DIELECTRIC CLASS 2
ANNEX C1 LIST OF TESTS AND SAMPLING PLAN FOR
QUALIFICATION APPROVAL, ASSESSEMENT LEVEL DZ
ANNEX C2 LIST OF TESTS FOR CONFORMANCE (LOT-BY-LOT)
INSPECTION, ASSESSMENT LEVEL DZ
ANNEX C3 LIST OF TESTS FOR CONFORMANCE (PERIODIC) -
INSPECTION, ASSESSMENT LEVEL DZ
ANNEX C4 TEST SCHEDULE FOR QUALIFICATION APPROVAL,
ASSESSMENT LEVEL DZ
ANNEX D DESTRUCTIVE PHYSICAL ANALYSIS (DPA)
Applies to fixed multi-layer ceramic chip capacitors.
| DocumentType |
Standard
|
| Pages |
54
|
| PublisherName |
National Standards Authority of Ireland
|
| Status |
Superseded
|
| SupersededBy |
| Standards | Relationship |
| DIN EN 132100:1997-04 | Identical |
| BS EN 132100:1997 | Identical |
| NEN EN 132100 : 1996 | Identical |
| SN EN 132100 : 1996 | Identical |
| EN 132100:1996 | Identical |
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