EN ISO 5436-1:2000
Current
The latest, up-to-date edition.
Geometrical Product Specifications (GPS) - Surface texture: Profile method; Measurement standards - Part 1: Material measures (ISO 5436-1:2000)
15-03-2000
Foreword
1 Scope
2 Normative references
3 Terms and definitions
4 Design requirements
4.1 Material
4.2 Size of measurement standard
5 Types, purposes and metrological characteristics of
measurement standards
5.1 General
5.2 Type A - Depth measurement standard
5.3 Type B - Tip condition measurement standard
5.4 Type C - Spacing measurement standard
5.5 Type D - Roughness measurement standard
5.6 Type E - Profile co-ordinate measurement standard
6 Measurement standard requirements
6.1 Type A - Depth measurement standard
6.2 Type B - Tip condition measurement standard
6.3 Type C - Spacing measurement standard
6.4 Type D - Roughness measurement standard
6.5 Type E - Profile co-ordinate measurement standard
7 Definition of the measurements for the measurement
standards
7.1 Type A1
7.2 Type A2 0025
7.3 Type B2
7.4 Type B3
7.5 Types C1 to C4, and D
7.6 Type E1
7.7 Type E2
8 Measurement standard certificate
Annex A (informative) Relation to the GPS matrix model
Bibliography
Defines the characteristics of material measures which are used as measurement standards (etalons) for the calibration of metrological characteristics of instruments for measuring surface texture by the profile method defined in ISO 3274.
| Committee |
CEN/TC 290
|
| DocumentType |
Standard
|
| PublisherName |
Comite Europeen de Normalisation
|
| Status |
Current
|
| Standards | Relationship |
| ISO 5436-1:2000 | Identical |
| PN EN ISO 5436-1 : 2002 | Identical |
| UNI EN ISO 5436-1 : 2001 | Identical |
| SN EN ISO 5436-1 : 2000 | Identical |
| BS EN ISO 5436-1:2001 | Identical |
| NF EN ISO 5436-1 : 2000 | Identical |
| NS EN ISO 5436-1 : 1ED 2000 | Identical |
| NEN EN ISO 5436-1 : 2000 | Identical |
| UNE-EN ISO 5436-1:2001 | Identical |
| I.S. EN ISO 5436-1:2000 | Identical |
| NBN EN ISO 5436-1 : 2000 | Identical |
| DIN EN ISO 5436-1:2000-11 | Identical |
| BS EN 623-4:2004 | Advanced technical ceramics. Monolithic ceramics. General and textural properties Determination of surface roughness |
| EN 1071-1:2003 | Advanced technical ceramics - Methods of test for ceramic coatings - Part 1: Determination of coating thickness by contact probe filometer |
| PREN 10049 : DRAFT 2013 | MEASUREMENT OF ROUGHNESS AVERAGE RA AND PEAK COUNT RPC ON METALLIC FLAT PRODUCTS |
| BS EN 10049:2013 | Measurement of roughness average <i>Ra</i> and peak count <i>RPc</i> on metallic flat products |
| I.S. EN 10049:2013 | MEASUREMENT OF ROUGHNESS AVERAGE RA AND PEAK COUNT RPC ON METALLIC FLAT PRODUCTS |
| DIN EN 1071-1:2003-06 | ADVANCED TECHNICAL CERAMICS - METHODS OF TEST FOR CERAMIC COATINGS - PART 1: DETERMINATION OF COATING THICKNESS BY CONTACT PROBE PROFILOMETER |
| VDI/VDE 2655 Blatt 1.1:2008-03 | Optical measurement and microtopographies - Calibration of interference microscopes and depth measurement standards for roughness measurement |
| VDI/VDE 2656 Blatt 1:2008-06 | Determination of geometrical quantities by using of Scanning Probe Microscopes - Calibration of measurement systems |
| VDI/VDE 2612 Blatt 5:2015-02 | Measurement and testing of gearings - Surface roughness measurement of cylindrical gears and bevel gears by means of stylus-type instruments |
| VDI/VDE 2602 Blatt 4:2014-09 | Surface measurement - Roughness measurement using contact (stylus) instruments - Calibration, uncertainty of measurement |
| I.S. EN 1071-1:2003 | ADVANCED TECHNICAL CERAMICS - METHODS OF TEST FOR CERAMIC COATINGS - PART 1: DETERMINATION OF COATING THICKNESS BY CONTACT PROBE FILOMETER |
| 13/30275599 DC : 0 | BS EN 10049 - MEASUREMENT OF ROUGHNESS AVERAGE RA AND PEAK COUNT RPC ON METALLIC FLAT PRODUCTS |
| DIN EN 623-4:2005-01 | Advanced technical ceramics - Monolithic ceramics - General and textural properties - Part 4: Determination of surface roughness; German version EN 623-4:2004 |
| UNI EN 10049 : 2014 | MEASUREMENT OF ROUGHNESS AVERAGE RA AND PEAK COUNT RPC ON METALLIC FLAT PRODUCTS |
| I.S. EN 623-4:2004 | ADVANCED TECHNICAL CERAMICS - MONOLITHIC CERAMICS - GENERAL AND TEXTURAL PROPERTIES - PART 4: DETERMINATION OF SURFACE ROUGHNESS |
| DIN EN 10049:2014-03 | Measurement of roughness average Ra and peak count RPc on metallic flat products |
| ISO 12179:2000 | Geometrical Product Specifications (GPS) Surface texture: Profile method Calibration of contact (stylus) instruments |
| EN 623-4:2004 | Advanced technical ceramics - Monolithic ceramics - General and textural properties - Part 4: Determination of surface roughness |
| BS EN 1071-1:2003 | Advanced technical ceramics. Methods of test for ceramic coatings Determination of coating thickness by contact probe filometer |
| BS EN ISO 12179:2001 | Geometrical product specifications (GPS). Surface texture. Profile method. Calibration of contact (stylus) instruments |
| EN 10049:2013 | Measurement of roughness average Ra and peak count RPc on metallic flat products |
| ISO/TR 14638:1995 | Geometrical product specification (GPS) Masterplan |
| ISO 4287:1997 | Geometrical Product Specifications (GPS) — Surface texture: Profile method — Terms, definitions and surface texture parameters |
| ISO 3274:1996 | Geometrical Product Specifications (GPS) — Surface texture: Profile method — Nominal characteristics of contact (stylus) instruments |
| ISO 10012-1:1992 | Quality assurance requirements for measuring equipment Part 1: Metrological confirmation system for measuring equipment |
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.