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EN 61837-2:2011/A1:2014

EN 61837-2:2011/A1:2014

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

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SURFACE MOUNTED PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION - STANDARD OUTLINES AND TERMINAL LEAD CONNECTIONS - PART 2: CERAMIC ENCLOSURES (IEC 61837-2:2011/A1:2014)

Superseded date

12-02-2022

Superseded by

EN IEC 61837-2:2018
EN IEC 61837-2:2018/A1:2020

Published date

30-05-2014

Publisher

European Committee for Standards - Electrical

FOREWORD
1 Scope
2 Normative references
3 Configuration of enclosures
4 Designation of types
5 Ceramic enclosure dimensions
6 Lead connections
7 Designation of ceramic enclosures
Bibliography
Annex ZA (normative) - Normative references to
         international publications with their
         corresponding European publications

Specifies the outlines and terminal lead connections as they apply to surface-mounted devices (SMD) for frequency control and selection in ceramic enclosures, and is based on IEC 61240.

Committee
SR 49
DevelopmentNote
To be read in conjunction with EN 61240. (07/2011)
DocumentType
Standard
PublisherName
European Committee for Standards - Electrical
Status
Superseded
SupersededBy
Supersedes

EN 60444-8:2017 Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units
BS EN 60444-8:2017 Measurement of quartz crystal unit parameters Test fixture for surface mounted quartz crystal units

EN 60862-1:2015 Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification
IEC 60191-6:2009 Mechanical standardization of semiconductor devices - Part 6: General rules for the preparation of outline drawings of surface mounted semiconductor device packages
EN 61019-1:2005 Surface acoustic wave (SAW) resonators - Part 1: Generic specification
EN 60368-2-2:1999 Piezoelectric filters - Part 2: Guide to the use of piezoelectric filters - Section 2: Piezoelectric ceramic filters
EN ISO 1101:2017 Geometrical product specifications (GPS) - Geometrical tolerancing - Tolerances of form, orientation, location and run-out (ISO 1101:2017)
IEC 60122-3:2010 Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections
EN 61240:2017 Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules
ISO 1101:2017 Geometrical product specifications (GPS) — Geometrical tolerancing — Tolerances of form, orientation, location and run-out
IEC 61019-1:2004 Surface acoustic wave (SAW) resonators - Part 1: Generic specification
IEC 60368-1:2000+AMD1:2004 CSV Piezoelectric filters of assessed quality - Part 1: Genericspecification
EN 60368-3:2010 Piezoelectric filters of assessed quality - Part 3: Standard outlines and lead connections
IEC 60862-1:2015 Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification
IEC 60368-3:2010 Piezoelectric filters of assessed quality - Part 3: Standard outlines and lead connections
IEC 61240:2016 Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules
IEC 61019-2:2005 Surface acoustic wave (SAW) resonators - Part 2: Guide to the use
IEC 60122-2:1983 Quartz crystal units for frequency control and selection - Part 2: Guide to the use of quartz crystal units for frequency control and selection
IEC 60862-2:2012 Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guidelines for the use
IEC 60862-3:2003 Surface acoustic wave (SAW) filters of assessed quality - Part 3: Standard outlines
EN 60679-3:2013 Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections
IEC 60368-2-2:1996 Piezoelectric filters - Part 2: Guide to the use of piezoelectricfilters - Section 2: Piezoelectric ceramic filters
EN 60862-3:2003 Surface acoustic wave (SAW) filters of assessed quality - Part 3: Standard outlines
EN 60862-2:2012 Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guidelines for the use
IEC 60679-3:2012 Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections
IEC 60679-2:1981 Quartz crystal controlled oscillators - Part 2: Guide to the use of quartz crystal controlled oscillators
EN 60191-6:2009 Mechanical standardization of semiconductor devices - Part 6: General rules for the preparation of outline drawings of surface mounted semiconductor device packages
IEC 60368-2-1:1988 Piezoelectric filters - Part 2-1: Guide to the use of piezoelectric filters - Quartz crystal filters
EN 60368-1:2000/A1:2004 PIEZOELECTRIC FILTERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
IEC 60679-1:2017 Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification
EN 60122-3:2010 Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections

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