EN 61751:1998
Withdrawn
A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.
Laser modules used for telecommunication - Reliability assessment
23-07-2013
10-04-1998
FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Laser reliability and quality assurance procedure
4.1 Demonstration of product quality
4.2 Testing responsibilities
4.3 Quality Improvement Programmes (QIPs)
5 Tests
5.1 Structural similarity
5.2 Burn-in and screening (when applicable in the DS)
6 Activities
6.1 Analysis of reliability results
6.2 Technical visits to LMMs
6.3 Design/process changes
6.4 Deliveries
6.5 Supplier documentation
Annex A (normative) Laser diode and laser module failure mechanisms
Annex B (informative) Guide
Annex ZA (normative) Normative references to international
publications with their corresponding European
publications
The aim of this standard is: - to establish a standard method of assessing the reliability of laser modules in order to minimize risks and to promote product development and reliability; - to establish means by which the distribution of failures with time can be determined. This should enable the determination of equipment failure rates for specified end of life criteria.
| Committee |
CLC/SR 86
|
| DocumentType |
Standard
|
| PublisherName |
European Committee for Standards - Electrical
|
| Status |
Withdrawn
|
| Standards | Relationship |
| NEN EN IEC 61751 : 1998 | Identical |
| SN EN 61751 : 1998 | Identical |
| PN EN 61751 : 2002 | Identical |
| NF EN 61751 : 1998 | Identical |
| IEC 61751:1998 | Identical |
| NBN EN 61751 : 1998 | Identical |
| I.S. EN 61751:1999 | Identical |
| UNE-EN 61751:1998 | Identical |
| BS EN 61751:1998 | Identical |
| CEI EN 61751 : 1999 | Identical |
| DIN EN 61751:1998-11 | Identical |
| MIL-STD-883 Revision K:2016 | TEST METHOD STANDARD - MICROCIRCUITS |
| EN 60068-2-1:2007 | Environmental testing - Part 2-1: Tests - Test A: Cold |
| HD 323.2.14 : 200S2 | BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST N: OF TEMPERATURE |
| IEC 60747-12-2:1995 | Semiconductor devices - Part 12: Optoelectronic devices - Section 2: Blank detail specification for laser diode modules with pigtail for fibre optic systems and sub-systems |
| IEC 60747-1:2006+AMD1:2010 CSV | Semiconductor devices - Part 1: General |
| IEC 60749:1996+AMD1:2000+AMD2:2001 CSV | Semiconductor devices - Mechanical and climatic test methods |
| ISO 9000:2015 | Quality management systems — Fundamentals and vocabulary |
| IEC 60068-2-1:2007 | Environmental testing - Part 2-1: Tests - Test A: Cold |
| IEC 60068-2-14:2009 | Environmental testing - Part 2-14: Tests - Test N: Change of temperature |
| EN ISO 9000:2015 | Quality management systems - Fundamentals and vocabulary (ISO 9000:2015) |
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.