EN 112000:1992
Withdrawn
A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.
Generic Specification: Image converter and image intensifier tubes
08-06-1993
24-11-1992
FOREWORD
PREFACE
SECTION 1 - SCOPE
SECTION 2 - GENERAL
2.1 Order of precedence
2.2 Related documents
2.3 Units, symbols and terminology
2.4 Marking
SECTION 3 - QUALITY ASSESSMENT PROCEDURES
3.1 Primary stage of manufacture
3.2 Structurally similar components
3.3 Qualification approval procedure
3.4 Supplementary procedure for qualification approval
3.5 Quality conformance inspection
3.6 Sampling requirements for small lots or for expensive
devices
3.7 Re-submission of rejected lots
3.8 Certified test records
3.9 Delayed delivery
3.10 Unchecked parameters
3.11 Periodic Inspection
3.12 Release for delivery before the completion of
Group B tests
SECTION 4 - TEST AND MEASUREMENT PROCEDURES
4.1 Alternative test methods
4.2 Standard conditions for testing
4.3 Test equipment
4.4 Visual inspection
4.5 Dimensions
4.6 Electrical and optical test and measurement procedures
4.7 Mechanical test and measurement procedures
4.8 Environmental test and measurement procedures
4.9 Endurance test and measurement procedures
This document applies to image converter and image intensifier tubes of assessed quality.
Committee |
CLC/SR 110
|
DocumentType |
Standard
|
PublisherName |
European Committee for Standards - Electrical
|
Status |
Withdrawn
|
Standards | Relationship |
NEN EN 112000 : 1997 | Identical |
NF EN 112000 : 2014 | Identical |
UNE-EN 112000:1992 | Identical |
NBN EN 112000 : 2008 | Identical |
BS EN 112000:1997 | Identical |
PN EN 112000 : 2002 | Identical |
DIN EN 112000:1996-10 | Identical |
BS E9006(1976) : LATEST | HARMONISED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS. BASIC SPECIFICATION. ENVIRONMENTAL PROCEDURES |
IEC 60134:1961 | Rating systems for electronic tubes and valves and analogous semiconductor devices |
BS E9007:1975 | Specification for harmonized system of quality assessment for electronic components: Basic specification: Sampling plans and procedures for inspection by attributes |
IEC 60306-1:1969 | Measurement of photosensitive devices - Part 1: Basic recommendations |
BS E9000-1(1977) : LATEST | |
BS 4727(1971) : LATEST | |
BS 6001(1972) : AMD 5054 | SAMPLING PROCEDURES FOR INSPECTION BY ATTRIBUTES - SPECIFICATION FOR SAMPLING PLANS INDEXED BY ACCEPTABLE QUALITY LEVEL (AQL) FOR LOT - BY - LOT INSPECTION |
BS E9000-2(1978) : LATEST | |
CECC 00400 : 86 ERRATUM 92 | HANDBOOK FOR THE PRODUCTION OF CECC DOCUMENTS |
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