DSCC 95525B:2023
Current
Current
The latest, up-to-date edition.
MICROCIRCUIT, DIGITAL, CMOS, QUAD ELECTRICALLY ERASABLE PROGRAMMABLE POTENTIOMETER, MONOLITHIC SILICON
Published date
14-03-2023
Publisher
This drawing documents two product assurance class levels consisting of high reliability (device class Q and M) and space application (device class V)
| DocumentType |
Standard
|
| PublisherName |
Defense Supply Centre Columbus
|
| Status |
Current
|
| MIL-STD-883 Revision K:2016 | TEST METHOD STANDARD - MICROCIRCUITS |
| MIL-HDBK-103 Revision AW:2016 | LIST OF STANDARD MICROCIRCUIT DRAWINGS |
| MIL-HDBK-780 Revision D:2004 | STANDARD MICROCIRCUIT DRAWINGS |
| MIL-PRF-38535 Revision K:2013 | Integrated Circuits (Microcircuits) Manufacturing, General Specification for |
| MIL-STD-1835 Revision D:2004 | ELECTRONIC COMPONENT CASE OUTLINES |
Sorry this product is not available in your region.
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.
Are you sure?
Logging out.