DSCC 01517G:2022
Current
Current
The latest, up-to-date edition.
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, RADIATION-HARDENED, 3.3 V, 32K X 8-BIT PROM, MONOLITHIC SILICON
Published date
08-12-2022
Publisher
This drawing documents two product assurance class levels consisting of high reliability (device class Q and M) and space application (device class V).
| DocumentType |
Standard
|
| PublisherName |
Defense Supply Centre Columbus
|
| Status |
Current
|
| Supersedes |
| MIL-STD-1835 Revision C:2000 | ELECTRONIC COMPONENT CASE OUTLINES |
| MIL-STD-883 Revision K:2016 | TEST METHOD STANDARD - MICROCIRCUITS |
| JEDEC JESD78F:2022 | IC Latch-Up Test |
| ASTM F 1192 : 2011 | Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices |
| MIL-HDBK-103 Revision AV:2016 | LIST OF STANDARD MICROCIRCUIT DRAWINGS |
| MIL-HDBK-780 Revision D:2004 | STANDARD MICROCIRCUIT DRAWINGS |
| MIL-PRF-38535 Revision K:2013 | Integrated Circuits (Microcircuits) Manufacturing, General Specification for |
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