CEI EN 61988-5 : 2011
Current
The latest, up-to-date edition.
PLASMA DISPLAY PANELS - PART 5: GENERIC SPECIFICATION
Hardcopy , PDF
English
01-01-2011
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FOREWORD
1 Scope
2 Normative references
3 Order of precedence
4 Terminology, units, symbols and abbreviations
5 Standard environmental conditions
6 Marking
7 Quality assessment procedures
8 Qualification approval procedure
9 Capability approval procedures
10 Test and measurement procedures
Annex A (normative) - Lot tolerance percentage
defective (LTPD) sampling plans
Annex B (informative) - General description of
specifications
Annex ZA (normative) - Normative references to
international publications with their
corresponding European publications
Describes the quality assessment to be used in the IECQ-CECC system and establishes general principles for describing and testing of electrical, optical, mechanical and environmental characteristics.
| Committee |
CT 309
|
| DevelopmentNote |
Classificazione CEI 47-70. (05/2011)
|
| DocumentType |
Standard
|
| Pages |
30
|
| PublisherName |
Comitato Elettrotecnico Italiano
|
| Status |
Current
|
| Standards | Relationship |
| EN 61988-5 : 2009 | Identical |
| IEC 61988-5:2009 | Identical |
| IEC 61988-1:2011 | Plasma display panels - Part 1: Terminology and letter symbols |
| EN 61988-1:2011 | Plasma display panels - Part 1: Terminology and letter symbols |
| EN 61988-4 : 2007 | PLASMA DISPLAY PANELS - PART 4: CLIMATIC AND MECHANICAL TESTING METHODS |
| IEC 61988-2-1:2012 | Plasma display panels - Part 2-1: Measuring methods - Optical and optoelectrical |
| IEC 61988-3-1:2005 | Plasma display panels - Part 3-1: Mechanical interface |
| IECQ 01:2014 | IEC QUALITY ASSESSMENT SYSTEM FOR ELECTRONIC COMPONENTS (IECQ SYSTEM) - BASIC RULES |
| IEC 60410:1973 | Sampling plans and procedures for inspection by attributes |
| ISO 3534-2:2006 | Statistics — Vocabulary and symbols — Part 2: Applied statistics |
| IEC 61988-4:2007 | Plasma display panels - Part 4: Climatic and mechanical testing methods |
| ISO 2859-10:2006 | Sampling procedures for inspection by attributes Part 10: Introduction to the ISO 2859 series of standards for sampling for inspection by attributes |
| IEC 60747-1:2006+AMD1:2010 CSV | Semiconductor devices - Part 1: General |
| EN 61988-2-2:2003 | Plasma display panels - Part 2-2: Measuring methods - Optoelectrical |
| EN 61988-3-1:2005 | Plasma display panels - Part 3-1: Mechanical interface |
| EN 61988-2-1:2012 | Plasma display panels - Part 2-1: Measuring methods - Optical and optoelectrical |
| IEC 61988-2-2:2003 | Plasma display panels - Part 2-2: Measuring methods - Optoelectrical |
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