BS QC 760200:1997
Current
The latest, up-to-date edition.
Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of the capability approval procedures
Hardcopy , PDF
English
15-08-1997
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1 Scope and object
2 General, preferred characteristics, ratings and
severities for environmental tests
2.1 Normative references
2.2 Preferred ratings and characteristics
2.3 Information to be given in a detail specification
3 Capability approval procedures
3.1 Selection of capability qualifying circuits (CQCs)
3.2 Structural similarity
3.3 Capability approval
3.4 Resubmission of rejected lots (lot-by-lot
inspection)
3.5 Manufacturing stages in a factory of an approved
manufacturer in a non-IEC member country
4 Test and measurement procedures
5 Tables for method B
Annexes
A Structural similarity rules for capability approval
B Minimum contents of a manufacturer's capability
manual for thick film circuits
C Minimum contents of a manufacturer's capability manual
for thin film circuits
Tables
1 Test schedule for capability approval for method A
2 Assessment levels and acceptance criteria for capability
approval for method A
3 Assessment levels and acceptance criteria for quality
conformance inspection for method A
4 Screening
5 Test schedule for capability approval for method B
6 Assessment levels and acceptance criteria for
capability approval for method B
7 Assessment levels and acceptance criteria for quality
conformance inspection for method B
Applicable to film integrated circuits and hybrid film integrated circuits manufactured as catalogue circuits when quality is assessed on a basis of capability approval.
| Committee |
EH/4
|
| DevelopmentNote |
Supersedes BS QC760200(1992) and 95/200682 DC. To be read in conjunction with BS QC 760000(1990) Also numbered as IEC 60748-22. (09/2003)
|
| DocumentType |
Standard
|
| Pages |
54
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
| Supersedes |
| IEC 60068-1:2013 | Environmental testing - Part 1: General and guidance |
| BS QC 760000:1990 | Harmonized system of quality assessment for electronic components. Film and hybrid film integrated circuits. Generic specification |
| IEC TR 60440:1973 | Method of measurement of non-linearity in resistors |
| IEC 60063:2015 | Preferred number series for resistors and capacitors |
| IEC 60748-2:1997 | Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits |
| IEC 60748-20-1:1994 | Semiconductor devices - Integrated circuits - Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits - Section 1: Requirements for internal visual examination |
| IEC 60748-21:1997 | Semiconductor devices - Integrated circuits - Part 21: Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of qualification approval procedures |
| IEC 60748-22-1:1997 | Semiconductor devices - Integrated circuits - Part 22-1: Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis of the capability approval procedures |
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