BS ISO 23830:2008

Foreword
Introduction
1 Scope
2 Symbols and abbreviations
3 Outline of method
4 Method for confirming the repeatability and constancy
  of the intensity scale
  4.1 Obtaining the reference sample
  4.2 Preparation for mounting the sample
  4.3 Mounting the sample
  4.4 Choosing the spectrometer settings for which intensity
      stability is to be determined
  4.5 Operating the instrument
  4.6 Measurements of the intensity and its repeatability
  4.7 Calculating the intensity repeatability
  4.8 Procedure for the regular determination of the constancy
      of the relative-intensity scale
  4.9 Next calibration
Annex A (informative) - Example of suitable operating conditions
                        for static SIMS
Bibliography

Describes a method for confirming the repeatability and constancy of the positive-ion relative-intensity scale of static secondary-ion mass spectrometers, for general analytical purposes.

This International Standard specifies a method for confirming the repeatability and constancy of the positive-ion relative-intensity scale of static secondary-ion mass spectrometers, for general analytical purposes. It is only applicable to instruments that incorporate an electron gun for charge neutralization. It is not intended to be a calibration of the intensity/mass response function. That calibration may be made by the instrument manufacturer or another organization. The present method provides data to confirm the constancy of relative intensities with instrument usage. Guidance is given on some of the instrument settings that may affect this constancy.