BS IEC 61747-1 : 1998 AMD 10788
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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LIQUID CRYSTAL AND SOLID-STATE DISPLAY DEVICES - GENERIC SPECIFICATION
15-06-2000
23-11-2012
1 Scope
2 Normative references
3 Terminology
3.1 Physical concepts
3.2 General terms
3.3 Terms related to ratings and characteristics
4 Technical aspects
4.1 Order of precedence
4.2 Terminology, units and symbols
4.3 Preferred values of temperature, humidity and
pressure
4.4 Marking
4.4.1 Device identification
4.4.2 Device traceability
4.4.3 Packing
4.5 Categories of assessed quality
4.6 Screening
4.7 Handling
5 Quality assessment procedures
5.1 Eligibility for qualification approval
5.1.1 Primary stage of manufacture
5.2 Commercially confidential information
5.3 Formation of inspection lots
5.4 Structurally similar devices
5.5 Granting of qualification approval
5.6 Quality conformance inspection
5.6.1 Division into groups and subgroups
5.6.2 Inspection requirements
5.6.3 Supplementary procedure for reduced inspection
5.6.4 Sampling requirements for small lots
5.6.5 Certified records of released lots (CRRL)
5.6.6 Delivery of devices subjected to destructive
or non-destructive tests
5.6.7 Delayed deliveries
5.6.8 Supplementary procedure for deliveries
5.7 Statistical sampling procedures
5.7.1 AQL sampling plans
5.7.2 LTPD sampling plans
5.8 Endurance tests
5.9 Endurance tests where the failure rate is specified
5.9.1 General
5.9.2 Selection of samples
5.9.3 Failure
5.9.4 Endurance test time and sample size
5.9.5 Procedure to be used if the number of
observed failures exceeds the acceptance
number
5.10 Accelerated test procedures
5.11 Capability approval
6 Test and measurement procedures
6.1 Standard atmospheric conditions for electrical and
optical measurements
6.2 Physical examination
6.2.1 Visual examination
6.2.2 Dimensions
6.2.3 Permanence of marking
6.3 Electrical and optical measurements
6.3.1 General conditions and precautions
6.4 Environmental tests
Annexes
A (informative) Cross references index
B (informative) Examples of outline drawings of liquid crystal
display cells
C (normative) Orientation of LCD modules
D (normative) Lot tolerance percentage defective (LTPD)
sampling plans
Provides a generic specification for liquid crystal and solid-state display devices. Specifies general methods for quality assessment for use in the IECQ system and gives general rules for measuring procedures of electrical and optical characteristics, rules for climatic and mechanical tests and rules for endurance tests. BS AMD 10788 RENUMBERS THIS STANDARD
| Committee |
EPL/47
|
| DevelopmentNote |
Renumbered and superseded by BS EN 61747-1. Supersedes 93/203880 DC. (01/2006)
|
| DocumentType |
Standard
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
| Standards | Relationship |
| IEC 61747-1:1998+AMD1:2003 CSV | Identical |
| ISO 1101:2017 | Geometrical product specifications (GPS) — Geometrical tolerancing — Tolerances of form, orientation, location and run-out |
| IEC 60747-5:1992 | Semiconductor devices - Discrete devices and integrated circuits -Part 5: Optoelectronic devices |
| IEC 60191-2:2012 DB | Mechanical standardization of semiconductor devices - Part 2: Dimensions |
| IEC 60410:1973 | Sampling plans and procedures for inspection by attributes |
| IEC 60747-1:2006+AMD1:2010 CSV | Semiconductor devices - Part 1: General |
| IEC 60191-3:1999 | Mechanical standardization of semiconductor devices - Part 3: General rules for the preparation of outline drawings of integrated circuits |
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