Customer Support: 131 242

  • Shopping Cart
    There are no items in your cart
We noticed you’re not on the correct regional site. Switch to our AMERICAS site for the best experience.
Dismiss alert

BS IEC 60747-5-4:2006

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

View Superseded by

Semiconductor devices. Discrete devices Optoelectronic devices. Semiconductor lasers

Available format(s)

Hardcopy , PDF

Superseded date

20-06-2022

Superseded by

BS IEC 60747-5-4:2022

Language(s)

English

Published date

30-06-2006

$443.41
Including GST where applicable

1 Scope
2 Normative references
3 General
  3.1 Physical concepts
  3.3 General terms
  3.4 Terms related to ratings and characteristics
4 Essential rating and characteristics
  4.1 Type
  4.2 Semiconductor
  4.3 Details of outline drawing and encapsulation
  4.4 Limiting values (absolute maximum ratings)
  4.5 Electrical and optical characteristics
  4.6 Supplementary information - Temperature dependence of
      wavelength
5 Measurement methods
  5.1 Power measurement
  5.2 Output power stability
  5.3 Time domain profile
  5.4 Lifetime
  5.5 Optical characteristics of the laser beam
Annex A (informative) Reference list of technical terms and
                      definitions related to spatial profile
                      and spectral characteristics
Annex B (informative) Reference list of measurement methods
                      related to spatial profile and spectral
                      characteristics
Annex C (informative) Reference list of technical terms and
                      definitions, and measurement methods,
                      related to power measurement and lifetime
Bibliography

Deals with the terminology, the essential ratings and characteristics as well as the measuring methods of semiconductor lasers.

Committee
EPL/47
DocumentType
Standard
Pages
32
PublisherName
British Standards Institution
Status
Superseded
SupersededBy

Deals with the terminology, the essential ratings and characteristics as well as the measuring methods of semiconductor lasers.

Standards Relationship
IEC 60747-5-4:2006 Identical

IEC 60270:2000+AMD1:2015 CSV High-voltage test techniques - Partial discharge measurements
ISO 11554:2017 Optics and photonics — Lasers and laser-related equipment — Test methods for laser beam power, energy and temporal characteristics
IEC 60050-731:1991 International Electrotechnical Vocabulary (IEV) - Part 731: Optical fibre communication
IEC 60068-1:2013 Environmental testing - Part 1: General and guidance
IEC 62007-1:2015 Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Specification template for essential ratings and characteristics
ISO 11146-1:2005 Lasers and laser-related equipment Test methods for laser beam widths, divergence angles and beam propagation ratios Part 1: Stigmatic and simple astigmatic beams
ISO 13694:2015 Optics and photonics Lasers and laser-related equipment Test methods for laser beam power (energy) density distribution
ISO 11146-2:2005 Lasers and laser-related equipment Test methods for laser beam widths, divergence angles and beam propagation ratios Part 2: General astigmatic beams
IEC 60050-845:1987 International Electrotechnical Vocabulary (IEV) - Part 845: Lighting
IEC 60825-1:2014 Safety of laser products - Part 1: Equipment classification and requirements
ISO 11670:2003 Lasers and laser-related equipment — Test methods for laser beam parameters — Beam positional stability
IEC 62007-2:2009 Semiconductor optoelectronic devices for fibre optic system applications - Part 2: Measuring methods
IEC 60306-1:1969 Measurement of photosensitive devices - Part 1: Basic recommendations
ISO 15367-1:2003 Lasers and laser-related equipment Test methods for determination of the shape of a laser beam wavefront Part 1: Terminology and fundamental aspects
ISO 13695:2004 Optics and photonics — Lasers and laser-related equipment — Test methods for the spectral characteristics of lasers
IEC 60747-1:2006+AMD1:2010 CSV Semiconductor devices - Part 1: General
IEC 60749:1996+AMD1:2000+AMD2:2001 CSV Semiconductor devices - Mechanical and climatic test methods
ISO 17526:2003 Optics and optical instruments Lasers and laser-related equipment Lifetime of lasers
ISO 12005:2003 Lasers and laser-related equipment Test methods for laser beam parameters Polarization
ISO 11145:2016 Optics and photonics Lasers and laser-related equipment Vocabulary and symbols
IEC 60664-1:2007 Insulation coordination for equipment within low-voltage systems - Part 1: Principles, requirements and tests
IEC 61751:1998 Laser modules used for telecommunication - Reliability assessment

Access your standards online with a subscription

Features

  • Simple online access to standards, technical information and regulations.

  • Critical updates of standards and customisable alerts and notifications.

  • Multi-user online standards collection: secure, flexible and cost effective.