BS EN 61000-4-29:2001
Current
The latest, up-to-date edition.
Electromagnetic compatibility (EMC). Testing and measurement techniques Testing and measurement techniques. Voltage dips, short interruptions and voltage variations on d.c. input power port immunity tests - Voltage dips, short interruptions and voltage variations on d.c.input power ports. Immunity tests. Basic EMC Publication.
Hardcopy , PDF
English
15-07-2001
Committee |
GEL/210
|
DevelopmentNote |
Also numbered as IEC 61000-4-29 (06/2001) Supersedes 97/260874 DC (05/2005)
|
DocumentType |
Standard
|
Pages |
22
|
PublisherName |
British Standards Institution
|
Status |
Current
|
Supersedes |
Establishes a common and reproducible basis for testing electrical and electronic equipment when subjected to voltage dips, short interruptions or voltage variations on d.c. power ports. This standard defines: - the range of test levels; - the test generator; - the test set-up; - the test procedure.
Standards | Relationship |
IEC 60738-1:2006 | Identical |
UNE-EN 61000-4-29:2002 | Identical |
SN EN 61000-4-29 : 2000 | Identical |
NF EN 61000-4-29 : 2001 | Identical |
DIN EN 61000-4-29 : 2001-10 | Identical |
EN 61000-4-29:2000 | Identical |
I.S. EN 61000-4-29:2000 | Identical |
EN 61000-4-11:2004/A1:2017 | ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 4-11: TESTING AND MEASUREMENT TECHNIQUES - VOLTAGE DIPS, SHORT INTERRUPTIONS AND VOLTAGE VARIATIONS IMMUNITY TESTS (IEC 61000-4-11:2004/A1:2017) |
IEC 61000-4-11:2004+AMD1:2017 CSV | Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests |
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