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BS EN 60749-4:2017

Current

Current

The latest, up-to-date edition.

Semiconductor devices. Mechanical and climatic test methods Damp heat, steady state, highly accelerated stress test (HAST)

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

28-11-2017

FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 HAST test - General remarks
5 Test apparatus
6 Test conditions
7 Procedure
8 Failure criteria
9 Safety
10 Summary
Annex ZA (normative) - Normative references to
         international publications with their
         corresponding European publications

Describes a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments.

Committee
EPL/47
DevelopmentNote
Supersedes 00/203564 DC (09/2002) Supersedes BS EN 60749. (09/2005) Supersedes 16/30341341 DC. (12/2017)
DocumentType
Standard
Pages
16
PublisherName
British Standards Institution
Status
Current
Supersedes

This part of IEC 60749 provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments.

Standards Relationship
UNE-EN 60749-4:2003 Identical
NBN EN 60749-4 : 2003 Identical
I.S. EN 60749-4:2017 Identical
IEC 60749-4:2017 Identical
EN 60749-4:2017 Identical
DIN EN 60749-4:2016-06 (Draft) Identical
NF EN 60749-4 : 2002 Identical

IEC 60749-5:2017 Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
EN 60749-5:2017 Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

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